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X-ray grazing incidence technique—corrections in residual stress measurement—a review

Published online by Cambridge University Press:  06 March 2012

S. Wroński ,
K. Wierzbanowski ,
A. Baczmański ,
A. Lodini ,
Ch. Braham  and
W. Seiler
S. Wroński
Affiliation:
Faculty of Physics and Applied Computer Sciences, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, Poland
K. Wierzbanowski
Affiliation:
Faculty of Physics and Applied Computer Sciences, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, Poland
A. Baczmański
Affiliation:
Faculty of Physics and Applied Computer Sciences, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, Poland
A. Lodini
Affiliation:
LACM, Université de Reims Champagne Ardenne, 9, Bd. de la Paix, 51100 Reims, France
Ch. Braham
Affiliation:
LIM, Ecole Nationale Supérieure d’Arts et Métiers, 151, Bd. de l’Hopital, 75013 Paris, France
W. Seiler
Affiliation:
LIM, Ecole Nationale Supérieure d’Arts et Métiers, 151, Bd. de l’Hopital, 75013 Paris, France
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Abstract

Using X-ray grazing incidence diffraction (GID) it is possible to perform a nondestructive analysis of the heterogeneous stress field for different volumes below the surface of the sample. The stress can be measured at very small depths, of the order of a few μm. The penetration depth of radiation is almost constant in a wide 2θ range for a given incidence angle α. It can be easily changed by an appropriate selection of α angle (or also by using a different type of radiation). There are, however, some factors which have to be corrected in this technique. The most important is the refraction of X-ray wave: it changes the wavelength and direction of the beam. Both effects modify a pick position. A corresponding correction was calculated and tested on ferrite powder and on 316L austenite stainless steel sample.

Keywords

diffractiongrazing incidenceresidual stressesX-ray refraction

Information

Type
Methods For Residual Stress Analysis
Information
Powder Diffraction , Volume 24 , Supplement S1 , June 2009 , pp. S11 - S15
Copyright
Copyright © Cambridge University Press 2009

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