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Application of deconvolutional treatment to powder diffraction data collected with a Bragg-Brentano diffractometer with a contaminated Cu target and a Ni filter

Published online by Cambridge University Press:  15 July 2020

Takashi Ida Open the ORCID record for Takashi Ida [Opens in a new window]
Takashi Ida*
Affiliation:
Advanced Ceramics Research Center, Nagoya Institute of Technology, Asahigaoka, Tajimi, Gifu507-0071, Japan
*
a)Author to whom correspondence should be addressed. Electronic mail: ida.takashi@nitech.ac.jp
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Abstract

A deconvolutional method for preprocessing powder diffraction data has been improved. The cumulants of instrumental aberration functions of Bragg-Brentano (Parrish) diffractometer calculated up to the fourth order are presented. The treatments of axial-divergence aberration and the effective spectroscopic profile of the source X-ray have been simplified from those used in previous methods. The current method has been applied to powder diffraction data collected with a Cu-target X-ray tube, used over 20 years, and a Ni-foil Kβ filter.

Keywords

Ni filterBragg-Brentano geometrydeconvolutionconvolution

Information

Type
Technical Article
Information
Powder Diffraction , Volume 35 , Issue 3 , September 2020 , pp. 166 - 177
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Copyright
Copyright © 2020 International Centre for Diffraction Data

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