Hostname: page-component-848d4c4894-nmvwc Total loading time: 0 Render date: 2024-06-19T22:46:31.616Z Has data issue: false hasContentIssue false

Crystal structure of Nd2−xMxRu2O7−y (M=Cu, Ag) pyrochlores by X-ray powder diffraction

Published online by Cambridge University Press:  01 March 2012

G. Kimmel
Affiliation:
Institutes for Applied Research, Ben-Gurion University of the Negev, P.O. Box 653, 84105 Beer-Sheva, Israel
H. On
Affiliation:
Materials Engineering Department, Ben-Gurion University of the Negev, P.O. Box 653, 84105 Beer-Sheva, Israel
D. Itzhak
Affiliation:
Materials Engineering Department, Ben-Gurion University of the Negev, P.O. Box 653, 84105 Beer-Sheva, Israel
J. Hormadaly
Affiliation:
Zandman Center for Thick Film Microelectronics and Chemistry Department, Ben-Gurion University of the Negev, P.O. Box 653, 84105 Beer-Sheva, Israel

Abstract

The crystal structures of ruthenium oxides with the general formula Nd2−xMxRu2O7−y, where M is Cu or Ag, 0≤x≤0.25, were investigated. All compounds that were prepared exhibit the pyrochlore structure with a cubic unit cell. The compounds were characterized by X-ray powder diffraction, and single-phase structures were found for Nd2−xCuxRu2O7−y, x=0.1, 0.2, 0.25, and for Nd2−xAgxRu2O7−y, x=0.1, 0.15, 0.2. The relative metal concentrations were verified by EDS. The cell parameters were determined by advanced peak-position analysis and calibrated by a Si internal standard. Atomic positions and oxygen occupancies where refined by the Rietveld method. It was found that the cell-size modifications agree with the relations between ionic sizes.

Type
Technical Articles
Copyright
Copyright © Cambridge University Press 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Carbonio, P., Alonso, J. A., and Martinez, J. L. (1999). “Oxygen vacancy control in the defect Bi2Ru2O7−y pyrochlore: a way to tune electronic bandwidth, ” J. Phys.: Condens. MatterJCOMEL10.1088/0953-8984/11/2/004 11, 361369.Google Scholar
Carcia, P. F., Ferreti, A., and Suna, A. (1982). “Partial size effects in thick film resistors, ” J. Appl. Phys.JAPIAU10.1063/1.331364 53, 52825288.CrossRefGoogle Scholar
Egdell, R. G., Goodenough, J. B., Hamnett, A., and Naish, C. C. (1983). “Electrochemistry of ruthenates. Part 1.—Oxygen reduction on pyrochlore ruthenates, ” J. Chem. Soc., Faraday Trans. 1JCFTAR10.1039/f19837900893 79, 893912.CrossRefGoogle Scholar
Field, M., Kennedy, B. J., and Hunter, B. A. (2000). “Structural studies of metal-nonmetal transition in Ru pyrochlores, ” J. Solid State Chem.JSSCBI10.1006/jssc.1999.8608 151, 2530.CrossRefGoogle Scholar
Garvey, R. (1986). “LSUCRIPC Least Square Unit Cell Refinement with Indexing on Personal Computer, ” Powder Diffr.PODIE2 1(1), 114.Google Scholar
Haouzi, A., Muller, J., and Joulbert, L. C. (1986). “Electric and crystallographic characterizations of pyrochlore type phases Nd2−yCuyRu2O7−y, ” Mater. Res. Bull.MRBUAC 21, 14891493.CrossRefGoogle Scholar
Horowitz, H. S., Longo, J. M., and Lewandowski, J. T. (1981). “New oxide pyrochlores: A 2[B 2−xA x]O7−y(A=Pb, Bi;B=Ru, Ir), ” Mater. Res. Bull.MRBUAC10.1016/0025-5408(81)90112-4 16, 489496.CrossRefGoogle Scholar
ICDD (1998). “Powder diffraction file, ” International Centre for Diffraction Data, edited by Frank McClune, 12 Campus Boulevard, Newtown Square, PA. 19073-3272.Google Scholar
ICDD (1999). “Powder diffraction file, ” International Centre for Diffraction Data, edited by Frank McClune, 12 Campus Boulevard, Newtown Square, PA. 19073-3272.Google Scholar
Kanno, R., Takeda, Y., Yammamoto, T., Kawamoto, Y., and Yamamoto, O. (1993). “Crystal structure and electrical properties of the pyrochlore reheated Bi2−xL n xRu2O7, ” J. Solid State Chem.JSSCBI10.1006/jssc.1993.1012 102, 106114.CrossRefGoogle Scholar
Kennedy, B. J. and Vogt, T. (1996). “Structural and bonding trends in ruthenium pyrochlores, ” J. Solid State Chem.JSSCBI10.1006/jssc.1996.0337 126, 261270.CrossRefGoogle Scholar
Kimmel, G. and Sarusi, B. (1995). “EXECAL: A computer program for calibration of line position in XRPD, ” Powder Diffr.PODIE2 10, 227229.Google Scholar
Kobayashi, H., Kanno, R., Kawamoto, Y., Kamiyama, T., Izumi, F., and Sleight, A. W. (1995). “Synthesis, crystal structure, and electrical properties of the pyrochlores Bi2−xL n xRu2O7−y(L n=Nd, Gd), ” J. Solid State Chem.JSSCBI10.1006/jssc.1995.1003 114, 1523.CrossRefGoogle Scholar
Koo, H.-J., Whangbo, M.-H., and Kennedy, B. J. (1998). “Similarities and differences in the structural and electronic properties of ruthenium and iridium pyrochlores A2M2O7−y(M=Ru, Ir), ” J. Solid State Chem.JSSCBI10.1006/jssc.1997.7705 136, 269273.CrossRefGoogle Scholar
Lee, K.-S., Seo, D.-K., and Whangbo, M.-H. (1997). “Structural and electronic factors governing the metallic and nonmetallic properties of the pyrochlores A2Ru2O7−y, ” J. Solid State Chem.JSSCBI10.1006/jssc.1997.7497 131, 405408.CrossRefGoogle Scholar
Pike, G. E. and Seager, C. H. (1977). “Electrical properties and conduction mechanisms of Ru-based thick film (cermet) resistors, ” J. Appl. Phys.JAPIAU10.1063/1.323595 48, 51525169.CrossRefGoogle Scholar
Rietveld, H. M. (1969). “A profile refinement method for nuclear and magnetic structures, ” J. Appl. Crystallogr.JACGAR10.1107/S0021889869006558 2, 6571.CrossRefGoogle Scholar
Rodrigez-Carvajal, J. (1997). “Fullprof, Program for Rietveld refinement, ” Laboratories Léon Brillouin (CEA-CNRS), Saclay, France.Google Scholar
Shannon, R. D. (1976). “Revised effective ionic radii and systematic studies of interatomic distances in halides and chalcogenides, ” Acta Crystallogr., Sect. A: Cryst. Phys., Diffr., Theor. Gen. Crystallogr.ACACBN10.1107/S0567739476001551 32, 751767.CrossRefGoogle Scholar
Yamamoto, T., Kanno, R., Takeda, Y., Yamamoto, O., Kawamoto, Y., and Takano, M. (1994). “Crystal structural and metal-semiconductor transition of the Bi2−xL n xRu2O7 pyrochlores (L n=Pr-Lu), ” J. Solid State Chem.JSSCBI10.1006/jssc.1994.1116 109, 372383.CrossRefGoogle Scholar
Young, R. A., Sakthivel, A., Moss, T. S., and Paiva-Santos, C. O. (1995). “DBWS-9411—an upgrade of the DBWS*.* programs for Rietveld refinement with PC and mainframe computers, ” J. Appl. Crystallogr.JACGAR10.1107/S0021889895002160 28, 366367.CrossRefGoogle Scholar
Zhu, W. J., Ting, S. T., and Hor, P. H. (1997). “Synthesis and characterization of ruthenium pyrochlores oxides La2−xCdxRu2O7−δ, ” J. Solid State Chem.JSSCBI10.1006/jssc.1996.7257 129, 308311.CrossRefGoogle Scholar