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Deconvolution–convolution treatment on powder diffraction data collected with Cu X-ray and Ni filter

  • Takashi Ida (a1), Shoki Ono (a1), Daiki Hattan (a1), Takehiro Yoshida (a1), Yoshinobu Takatsu (a1) and Katsuhiro Nomura (a2)...
Abstract

A method to remove small Cu peaks and step structures caused by NiK-edge absorption as well as Cu2 sub-peaks from powder diffraction intensity data measured with Cu-target X-ray source and Ni-foil filter is proposed. The method is based on deconvolution–convolution treatment applying scale transform of abscissa, Fourier transform, and a realistic spectroscopic model for the source X-ray. The validity of the method has been tested by analysis of the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with the combination of Cu X-ray source, Ni-foil filter, flat powder specimen and one-dimensional Si strip detector. The diffraction intensity data treated with the method have certainly shown background intensity profile without Cu peaks and NiK-edge step structures.

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a)Author to whom correspondence should be addressed. Electronic mail: ida.takashi@nitech.ac.jp
References
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Powder Diffraction
  • ISSN: 0885-7156
  • EISSN: 1945-7413
  • URL: /core/journals/powder-diffraction
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