Skip to main content

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
Cancel
×
×
Home
  • Home
Article
  • Cited by 7
  • Cited by
    Crossref Citations
    Crossref logo
    This article has been cited by the following publications. This list is generated based on data provided by CrossRef.
    Arias, D.F. Gómez, A. Souza, R.M. and Vélez, J.M. 2018. Residual stress gradient of Cr and CrN thin films. Materials Chemistry and Physics, Vol. 204, Issue. , p. 269.
    Meixner, M. Fuss, T. Klaus, M. and Genzel, Ch. 2015. Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method. I. Theoretical concept. Journal of Applied Crystallography, Vol. 48, Issue. 5, p. 1451.
    Broadhurst, A. Rogers, K. D. Lane, D. W. and Lowe, T. W. 2005. The direct determination of X-ray diffraction data from specific depths. Powder Diffraction, Vol. 20, Issue. 03, p. 233.
    Schuster, T. Plöger, J. and Louis, A. K. 2003. Depth-resolved residual stress evaluation from X-ray diffraction measurement data using the approximate inverse method. Zeitschrift für Metallkunde, Vol. 94, Issue. 8, p. 934.
    Kötschau, I.M. and Schock, H.W. 2003. Depth profile of the lattice constant of the Cu-poor surface layer in (Cu2Se)1−x(In2Se3)x evidenced by grazing incidence X-ray diffraction. Journal of Physics and Chemistry of Solids, Vol. 64, Issue. 9-10, p. 1559.
    Murthy, N.S. Bednarczyk, C. and Minor, H. 2000. Depth-profiles of structure in single- and multilayered commercial polymer films using grazing-incidence X-ray diffraction. Polymer, Vol. 41, Issue. 1, p. 277.
    Luo, Jian Tao, Kun Yin, Hong and Du, Yong 1996. Studies on quantitative x‐ray diffraction characterization of phase depth profiles. Review of Scientific Instruments, Vol. 67, Issue. 8, p. 2859.
    ×
  • Access

Determination of depth profiles from X-ray diffraction data

  • Paul Predecki (a1)
Abstract

A direct method is described for determining depth profiles (z-profiles) of diffraction data from experimentally determined τ-profiles, where z is the depth beneath the sample surface and τ is the 1/e penetration depth of the X-ray beam. With certain assumptions, the relation between these two profile functions can be expressed in the form of a Laplace transform. The criteria for fitting experimental τ-data to functions which can be utilized by the method are described. The method was applied to two τ-data sets taken from the literature: (1) of residual strain in an A1 thin film and (2) of residual stress in a surface ground A12O3/5vol% TiC composite. For each data set, it was found that the z-profiles obtained were of two types: oscillatory and nonoscillatory. The nonoscillatory profiles appeared to be qualitatively consistent for a given data set. The oscillatory profiles were considered to be not physically realistic. For the data sets considered, the nonoscillatory z-profiles were found to lie consistently above the corresponding τ-profiles, and to approach the τ-profiles at large z, as expected from the relation between the two.

    •
      • Send article to Kindle

      To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

      Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

      Find out more about the Kindle Personal Document Service.

      Determination of depth profiles from X-ray diffraction data
      Available formats
      ×
      Send article to Dropbox

      To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

      Determination of depth profiles from X-ray diffraction data
      Available formats
      ×
      Send article to Google Drive

      To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

      Determination of depth profiles from X-ray diffraction data
      Available formats
      ×
Copyright
COPYRIGHT: © Cambridge University Press 1993
References
Hide All
Cohen, J. B., Dolle, H., and James, M. R. (1980). “Accuracy in powder diffraction,” NBS Special Publication No. 567 (U.S. Govt. Printing Office, Washington, D.C.), pp. 453–477.
Doerner, M. F., and Brennan, S. (1988). J. Appl. Phys., 63, 126–131.
Dolle, H. (1979). J. Appl. Cryst. 12, 489–501.
Eigenmann, B., Scholtes, B., and Macherauch, E. (1989). Mater. Sci. Eng. A118, 1–17.
Erdelyi, A., Magnus, W., Oberhettinger, F., and Tricomi, F. G. (1954). The Bateman Manuscript Project, Tables of Integral Transforms, Vol. I (McGraw Hill, New York).
Fillit, R. Y., and Perry, A. J. (1988). Surface and Coatings Technology 36, 647–659.
Hall, E. O. (1951). Proc. Phys. Soc. B64, 747.
Hauk, V. M. (1984). Adv. X-ray Anal. 27, 101–120.
Houska, C. R. (1980). “Treatise on Materials Science and Technology” in Experimental Methods, Part A, edited by Herman, H. (Academic, New York), Vol. 19A, pp. 63–105.
Hwang, Bing, and Houska, C. R. (1988). J. Appl. Phys. 63 5351–5356.
Noyan, I. C. (1984). Metall Trans. A 14A, 249–258.
Noyan, I. C., and Cohen, J. B. (1984). Adv. X-ray Anal. 27, 129–148.
Noyan, I. C., and Cohen, J. B. (1987). Residual Stress, Measurement by Diffraction and Interpretation (Springer Verlag, New York), p. 144.
Petch, N. J. (1953). JISI 173, 25.
Predecki, P. K., Zhu, X., and Ballard, B. (1993). Adv. X-ray Anal. 36.
Roll, E. D., Pangborn, R. N., and Amateau, M. F. (1987). Nondestructive Characterization of Materials II edited by Bussiere, J. F., Monchalin, J-P., Ruud, C. O., and Green, R. E. Jr., (Plenum, New York) pp. 595–603.
Sasaki, T., Kuramoto, M., and Yoshioka, Y. (1984). Adv. X-ray Anal. 27, 121–128.
Shiraiwa, T., and Sakamoto, Y. (1972). Sumitomo Search 7, 109–135.
Shute, C. J., and Cohen, J. B. (1991). J. Appl. Phys. 70, 2104–2110.
Somers, M. A. J., and Mittemeijer, E. J. (1990). Metal. Trans. 21A, 189–204.
Warren, B. E., X-Ray Diffraction (Addison-Wesley, Reading, MA, 1969), p. 49.
Recommend this journal

Email your librarian or administrator to recommend adding this journal to your organisation's collection.

Powder Diffraction
  • ISSN: 0885-7156
  • EISSN: 1945-7413
  • URL: /core/journals/powder-diffraction
Please enter your name
Please enter a valid email address
Who would you like to send this to? *

CAPTCHA *

Skip to the audio challenge
×

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 11 *
Loading metrics...

Abstract views

Total abstract views: 151 *
Loading metrics...

* Views captured on Cambridge Core between September 2016 - 12th June 2018. This data will be updated every 24 hours.

Cancel
Confirm
×