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Developing a method for the evaluation of dislocation parameters from the Rietveld refinement procedure

Published online by Cambridge University Press:  10 June 2016

Saba Khalili ,
Vishtasb Soleimanian  and
Ali Mokhtari
Saba Khalili
Affiliation:
Department of Physics, Faculty of Sciences, Shahrekord University, P.O. Box 115, Shahrekord, Iran
Vishtasb Soleimanian*
Affiliation:
Department of Physics, Faculty of Sciences, Shahrekord University, P.O. Box 115, Shahrekord, Iran Nanotechnology Research Center, Shahrekord University, 8818634141 Shahrekord, Iran
Ali Mokhtari
Affiliation:
Department of Physics, Faculty of Sciences, Shahrekord University, P.O. Box 115, Shahrekord, Iran
*
a)Author to whom correspondence should be addressed. Electronic mail: soleimanian@sci.sku.ac.ir
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Abstract

In this investigation, the ability of Rietveld refinement method was used to simultaneously refine the structure and microstructure and evaluate the linear defects of cubic crystals. To do this, the basis of Stephans theory, about the anisotropic strain broadening, was developed and the values of dislocation density as well as the fraction of dislocation types were estimated. The reliability of this procedure was checked by selecting four different nanocrystaslline samples and evaluating the microstructure of these materials. Finally, the results were compared with those extracted from the whole powder pattern modeling method. Good agreement was achieved between the results of two methods.

Keywords

X-ray diffraction analysisRietveld refinementmicrostructuredislocation parameters

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Type
Technical Articles
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Powder Diffraction , Volume 31 , Issue 3 , September 2016 , pp. 198 - 204
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Copyright
Copyright © International Centre for Diffraction Data 2016 

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