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Equations for quantifying Fe and K within the illite structure using X-ray powder diffraction

Published online by Cambridge University Press:  06 March 2012

Il Mo Kang ,
Hi-Soo Moon ,
Yungoo Song  and
Myung Hun Kim
Il Mo Kang
Affiliation:
Department of Earth System Sciences, Yonsei University, 134, Sinchon-dong, Seodaemunku, Seoul, 120-749, Korea
Hi-Soo Moon*
Affiliation:
Department of Earth System Sciences, Yonsei University, 134, Sinchon-dong, Seodaemunku, Seoul, 120-749, Korea
Yungoo Song
Affiliation:
Department of Earth System Sciences, Yonsei University, 134, Sinchon-dong, Seodaemunku, Seoul, 120-749, Korea
Myung Hun Kim
Affiliation:
Department of Chemistry, Yonsei University, 134, Sinchon-dong, Seodaemunku, Seoul, 120-749, Korea
*
a)Author to whom correspondence should be addressed. Electronic mail: hsmoon@yonsei.ac.kr
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Abstract

This study was performed to suggest convenient equations for quantifying Fe and K within the illite structure using relative intensities for the illite basal reflections. The 002/005 and 003/005 ratios were available for Fe and K quantifications, and equations could be derived as the following: CFe=(ln I002/005−1.807 ln I003/005+1.29)/(1.241 ln I003/005−3.843), CK=−(ln I002/005+0.121 ln I003/005−2.592)/(1.308 ln I003/005+1.984). The equations may obtain Fe and K contents within ca. ±0.05 atoms per half-unit cell, if incident radiation loss is minimized and basal reflection modification caused by expandable layers is eliminated. © 2004 International Centre for Diffraction Data.

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Type
Technical Articles
Information
Powder Diffraction , Volume 19 , Issue 3 , September 2004 , pp. 247 - 248
Copyright
Copyright © Cambridge University Press 2004

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References

Drits, V. A., Środoń, J., and Eberl, D. D. (1997). “XRD measurement of mean crystallite thickness of illite and illite/smectite: Reappraisal of the Kubler index and the Scherrer equation,” Clays Clay Miner. CLCMAB 45, 461–475. cld, CLCMAB CrossRefGoogle Scholar
Eberl, D. D., Drits, V., Środoń, J., and Nüesch, R. (1996). “MudMaster, A program for calculating crystallite size distributions and strain from the shapes of x-ray diffraction peaks,” U.S. Geological Survey, Open File Report 96–171.Google Scholar
Moore, D. M. and Reynolds, R. C. (1997). X-ray Diffraction and the Identification and Analysis of Clay Minerals, 2nd ed. (Oxford University Press, Oxford and New York).Google Scholar
Newman, A. C. D. and Brown, G. (1987). “The chemical constitution of clays,” in Chemistry of Clays and Clay Minerals, edited by A. C. D. Newman (Mineralogical Society, London), pp. 1–128.Google Scholar
Reynolds, R. C. and Reynolds, R. C. (1996). “NEWMOD© for Windows, a computer program for the calculation of one-dimensional x-ray diffraction patterns of mixed-layered clay minerals,” Hanover, New Hampshire.Google Scholar