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Handy waveguide TXRF spectrometer for nanogram sensitivity

Published online by Cambridge University Press:  29 February 2012

Shinsuke Kunimura  and
Jun Kawai
Shinsuke Kunimura
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Kyoto, 606-8501, Japan
Jun Kawai*
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Kyoto, 606-8501, Japan
*
Author to whom correspondence should be addressed. Electronic mail: jun.kawai@materials.mbox.media.kyotou.ac.jp
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Abstract

A specimen containing nanograms of sulfur, calcium, and 3d transition metal elements was measured by incident X-ray beams of various sizes restricted by a waveguide placed in a portable TXRF spectrometer. The signal to background ratios of spectra decreased with an increase in incident X-ray beam size. The portable spectrometer was also applied to rainwater and a specimen containing antimony and rare earth elements. Nanograms of elements in these specimens were detected by K-line or L-line excitation.

Keywords

incident X-ray beamportable spectrometerTXRFwaveguideX-ray fluorescence
Type
X-Ray Fluorescence
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 146 - 149
Copyright
Copyright © Cambridge University Press 2008

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