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Improved X-ray powder diffraction data for Ti2AlN

Published online by Cambridge University Press:  10 January 2013

M. Y. Gamarnik ,
M. W. Barsoum  and
T. El-Raghy
M. Y. Gamarnik
Affiliation:
Department of Materials Engineering, Drexel University, Philadelphia, Pennsylvania 19104
M. W. Barsoum
Affiliation:
Department of Materials Engineering, Drexel University, Philadelphia, Pennsylvania 19104
T. El-Raghy
Affiliation:
Department of Materials Engineering, Drexel University, Philadelphia, Pennsylvania 19104
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Abstract

A complete set of d spacings, intensities, and h, k, l indexes for Ti2AlN has been determined from X-ray powder diffraction. The lattice parameters are a=2.989(2) Å, c=13.614(5) Å; in good agreement with previous work. The new set of results comprises seven reflections not present in the current Ti2AlN PDF card No. 18-70. Furthermore, a new set of relative intensities are reported that are in better agreement with the calculated values than they are with those listed in the PDF card.

Information

Type
New Diffraction Data
Information
Powder Diffraction , Volume 15 , Issue 4 , December 2000 , pp. 241 - 242
Copyright
Copyright © Cambridge University Press 2000

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References

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