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In situ structural analysis of BPDA-PPD polyimide thin film using two-dimensional grazing incidence X-ray diffraction

Published online by Cambridge University Press:  29 February 2012

J. Kikuma ,
T. Nayuki ,
T. Ishikawa ,
S. Matsuno  and
G. Asano
J. Kikuma*
Affiliation:
Analysis and Simulation Center, Asahi-KASEI Corporation, Shizuoka, Japan
T. Nayuki
Affiliation:
Analysis and Simulation Center, Asahi-KASEI Corporation, Shizuoka, Japan
T. Ishikawa
Affiliation:
Analysis and Simulation Center, Asahi-KASEI Corporation, Shizuoka, Japan
S. Matsuno
Affiliation:
Analysis and Simulation Center, Asahi-KASEI Corporation, Shizuoka, Japan
G. Asano
Affiliation:
Marketing Center, FPC/FPD Materials, Asahi-KASEI Corporation, Shizuoka, Japan
*
a)Author to whom correspondence should be addressed. Electronic mail: kikuma.jb@om.asahi-kasei.co.jp
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Abstract

Structural development of BPDA-PPD polyimide thin film has been investigated by in situ grazing incidence X-ray diffraction at the BL24XU beamline of the SPring-8. Optimizing the sample shape, two-dimensional images were measured successfully without sacrificing angle resolution. It has been clearly shown that the crystallization first begins in the in-plane direction, at the curing temperature of 180 °C, in which the periodic structure of the molecular chain axis (c axis) is developed. The crystallization in the surface normal (out-of-plane) direction is observed later, at the curing temperature above 300 °C. A slight increase of the d spacing of the c axis during heating process has been observed, suggesting the stretching of the contracted molecular chain in accordance with the curing process. In the cooling process, the decrease of the d spacings for a and b axes was considerable, which indicates thermal expansion of the crystals at high temperatures. The increases in the peak intensities during the cooling process have been observed, which indicate the d spacing of each axis becomes close to the equilibrium value to produce higher periodicity.

Keywords

polyimidecuring processorientationGIXDtwo-dimensionalin situ
Type
X-Ray Diffraction
Information
Powder Diffraction , Volume 23 , Issue 2 , June 2008 , pp. 109 - 112
Copyright
Copyright © Cambridge University Press 2008

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