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Low-power total reflection X-ray fluorescence spectrometer using diffractometer guide rail

Published online by Cambridge University Press:  15 October 2014

Ying Liu ,
Susumu Imashuku  and
Jun Kawai
Ying Liu*
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Yoshida Honmachi, Sakyo-ku, Kyoto 606-8501, Japan
Susumu Imashuku
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Yoshida Honmachi, Sakyo-ku, Kyoto 606-8501, Japan
Jun Kawai
Affiliation:
Department of Materials Science and Engineering, Kyoto University, Yoshida Honmachi, Sakyo-ku, Kyoto 606-8501, Japan
*
a) Author to whom correspondence should be addressed. Electronic mail: liu.ying.48r@st.kyoto-u.ac.jp
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Abstract

An X-ray diffractometer (XRD) was modified to a low-power total reflection X-ray fluorescence (TXRF) spectrometer. This was realized by reducing the XRD tube power (3 kW) down to 10 W by a Spellman power supply. The present spectrometer consisted of a waveguide slit, Si-PIN detector, a goniometer and two Z-axis stages that were set on a diffractometer guide rail. This unit was easy in assembly. The first measurements with this spectrometer were presented. The minimum detection limit for Cr was estimated to be a few nanograms or at the level of 1013 atoms cm−2.

Keywords

low-power TXRFhigh-power XRD tubepower supplydiffractometer guide rail

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Type
Technical Articles
Information
Powder Diffraction , Volume 30 , Issue 1 , March 2015 , pp. 36 - 39
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Copyright
Copyright © International Centre for Diffraction Data 2014 

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