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Measurement of coating thickness with X-ray diffraction

Published online by Cambridge University Press:  03 April 2023

M. Witte Open the ORCID record for M. Witte [Opens in a new window]
M. Witte*
Affiliation:
Salzgitter Mannesmann Forschung GmbH, Eisenhüttenstr. 99, 38239 Salzgitter, Germany
*
a)Author to whom correspondence should be addressed. Electronic mail: m.witte@sz.szmf.de
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Abstract

X-ray fluorescence (XRF) is frequently used to measure layer thickness in the micrometer range. But also X-ray diffraction (XRD) can be used in a comparable way and offers the benefit to differentiate coating layers by their crystal structure. Thus, the thickness of different oxide layers of the same element can be determined, e.g., FeO, Fe3O4, and Fe2O3 on Fe-substrate. An approach for such measurement is discussed. Furthermore, with a suitable sample stage, a spatially resolved coating thickness map can be measured in a nondestructive way. Applications and validations of the presented XRD method for the measurement of the thickness of zinc coatings on steel are given and compared with results from XRF, glow-discharge optical emission spectroscopy, and optical micrographs. In addition, the methodology was tested and validated using XRF reference standards and iron nitride and iron oxide layers.

Keywords

XRDcoating thicknessX-ray absorbtion
Type
Proceedings Paper
Information
Powder Diffraction , Volume 38 , Issue 2 , June 2023 , pp. 112 - 118
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Copyright
Copyright © The Author(s), 2023. Published by Cambridge University Press on behalf of International Centre for Diffraction Data

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References

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