Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-10-30T04:49:23.720Z Has data issue: false hasContentIssue false

A Method for Quantitative Phase Analysis of Silicon Nitride by X-Ray Diffraction

Published online by Cambridge University Press:  10 January 2013

David J. Devlin
Affiliation:
Norton Company, Advanced Ceramics, Northboro, Massachusetts, U.S.A.
Kamal E. Amin
Affiliation:
Norton Company, Advanced Ceramics, Northboro, Massachusetts, U.S.A.

Abstract

The relative intensities ratios for the determination of the relative amounts of alpha and beta phases in silicon nitride and the relative amounts of delta yttrium disilicate (Y2Si2O7) and nitrogen apatite [Y5(SiO4)3N] are reported. These constants were determined using an iterative method applicable when the pure phases are not easily prepared. In addition, a calibration curve was obtained for the quantitative measurement of free silicon in silicon nitride over the range 0 to 0.3% by weight of Si.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Amin, K.E., Siebein, K.N. & Wade, J.A. (1989). Intermediate temperature oxidation in silicon nitride yttria ceramics. J. Mater. Sci. 24 (12), 4253.CrossRefGoogle Scholar
Gazzara, et al. , (1977). Determination of phase content of Si3N4 by X-ray diffraction analysis. Am. Ceram. Soc. Bull. 56 (9), 777.Google Scholar
Hubbard, C.R. & Snyder, R.L. (1988). RIR-Measurement and use in quantitative XRD. Powder Diffr. 3, 74.CrossRefGoogle Scholar
Klug, H.P. & Alexander, L.F. (1974). X-Ray Diffraction Procedures, 2nd ed. p 531 et seq. New York: J. Wiley & Sons.Google Scholar
Lee, W.E. & Hilmas, G.E. (1989). Microstructural changes in β-silicon nitride grains upon crystallizing the grain-boundary glass. J. Am. Ceram. Soc. 72(10), 931.CrossRefGoogle Scholar
Mencik, Z., Short, M.A. & Peters, C.R. (1980). Quantitative phase analysis of synthetic silicon nitride by X-ray diffraction. In Adv. X-Ray Anal. 23, 375. New York: Plenum.Google Scholar
Schreiner, W.N. & Jenkins, R. (1983). Profile fitting for quantitative analysis in X-ray powder diffraction. In Adv. X-Ray Anal. 26, 141148. New York: Plenum.Google Scholar