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Microdiffraction using two-dimensional detectors

Published online by Cambridge University Press:  06 March 2012

Bob Baoping He
Bob Baoping He*
Affiliation:
Bruker AXS Inc., 5465 East Cheryl Parkway Madison, Wisconsin 53711
*
a)Author to whom correspondence should be addressed; Electronic mail: bhe@bruker-axs.com
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Abstract

X-ray diffraction analysis on small samples or micro-area of large samples is always a challenge due to weak diffraction and poor statistics, especially when dealing with samples containing large grain size, inhomogeneous phase distribution, and preferred orientation. Two-dimensional X-ray diffraction has many advantages in microdiffraction analysis. A two-dimensional detector can collect a large amount of data both in terms of speed and angular coverage. This paper covers some aspects about instrumentation of two-dimensional X-ray diffraction and its applications in phase identification and stress analysis on small samples and micro-area of large samples.

Information

Type
Special Section on Microanalysis
Information
Powder Diffraction , Volume 19 , Issue 2 , June 2004 , pp. 110 - 118
Copyright
Copyright © Cambridge University Press 2004

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References

Bergese, P., Bontempi, E., Colombo, I., and Depero, L. E. (2001). “Micro X-ray diffraction on capillary powder samples: A novel and effective technique for overcoming preferred orientation,” J. Appl. Crystallogr. JACGAR 34, 663–665. acr, JACGAR Google Scholar
Bhuvanesh, N. S. P.and Reibenspies, J. H. (2003). “A novel approach to micro-sample X-ray powder diffraction using nylon loops,” Powder Diffr. PODIE2 36, 1490–1481. pdj, PODIE2 Google Scholar
Blanton, T. N. (2003). “X-ray film as a two-dimensional detector for X-ray diffraction analysis,” Powder Diffr. PODIE2 18, 91–98. pdj, PODIE2 CrossRefGoogle Scholar
Durst, R. D. et al. (2003). “Novel, photon counting X-ray detector,” Powder Diffr. PODIE2 18, 103–105. pdj, PODIE2 CrossRefGoogle Scholar
Eatough, M. O., Rodriguez, M. A., Blanton, T. N., and Tissot, R. G. (1998). “A comparison of detectors used for microdiffraction applications,” Adv. X-ray Anal. AXRAAA 42, 319–326. axr, AXRAAA Google Scholar
Goehner, R. P., Eatough, M. O., Michael, J. R., and Tissot, R. G. (2000). “Microbeam crystallographic and elemental analysis,” Adv. X-ray Anal. AXRAAA 8, 215–222. axr, AXRAAA Google Scholar
Goldsmith, C. C.and Walker, G. A. (1983). “Small area X-ray diffraction techniques; Applications of the micro-diffractometer to phase identification and strain determination,” Adv. X-ray Anal. AXRAAA 27, 229–238.Google Scholar
He, B. B. (2003). “Introduction to two-dimensional X-ray diffraction,” Powder Diffr. PODIE2 18, 71–85. pdj, PODIE2 Google Scholar
He, B. B. (2000). “Residual stress measurement with two-dimensional diffraction (invited),” The 20th ASM Heat Treating Society Conference Proceedings, St. Louis, MO, Vol. 1, pp. 408–417.Google Scholar
He, B. B.and Preckwinkel, U. (2001). “X-ray optics for two-dimensional diffraction,” Adv. X-ray Anal. AXRAAA 45, 332–337. axr, AXRAAA Google Scholar
He, B. B. and Smith, K. L. (1998). “Fundamental equation of strain and stress measurement using 2D detectors,” Proceedings of 1998 SEM Spring Conference on Experimental and Applied Mechanics, Houston, TX.Google Scholar
Kugler, W. (2002). “X-ray diffraction analysis in the forensic science: The last resort in many criminal cases,” Adv. X-ray Anal. AXRAAA 46, 1–16. axr, AXRAAA Google Scholar
Rudolf, P. R.and Landes, B. G. (1994). “Two-dimensional X-ray diffraction and scattering of microcrystalline and polymeric materials,” Aust. Road Res. ARDRAH 9, 22–33. 8sj, ARDRAH Google Scholar
Sulyanov, S. N., Popov, A. N., and Kheiker, D. M. (1994). “Using a Two-dimensional Detector for X-ray Powder Diffractometry,” J. Appl. Crystallogr. JACGAR 27, 934–942. acr, JACGAR Google Scholar
Tissot, R. G. (2003). “Microdiffraction applications utilizing a two-dimensional proportional detector,” Powder Diffr. PODIE2 18, 86–90. pdj, PODIE2 CrossRefGoogle Scholar
Winter, D. J.and Squires, B. A. (1994). “A new approach in performing microdiffraction analysis,” Adv. X-ray Anal. AXRAAA 38, 551–556. axr, AXRAAA Google Scholar