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Microstructure anisotropy in CuO powders

Published online by Cambridge University Press:  06 March 2012

A. E. Bianchi ,
L. Montenegro ,
R. Viña  and
G. Punte
A. E. Bianchi
Affiliation:
Lanadi e IFLP, Departamento de Física, Facultad de encias Exactas, Universidad Nacional de La Plata, CC67-1900, La Plata, Argentina
L. Montenegro
Affiliation:
Lanadi e IFLP, Departamento de Física, Facultad de encias Exactas, Universidad Nacional de La Plata, CC67-1900, La Plata, Argentina
R. Viña
Affiliation:
Lanadi e IFLP, Departamento de Física, Facultad de encias Exactas, Universidad Nacional de La Plata, CC67-1900, La Plata, Argentina
G. Punte
Affiliation:
Lanadi e IFLP, Departamento de Física, Facultad de encias Exactas, Universidad Nacional de La Plata, CC67-1900, La Plata, Argentina
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Abstract

An anisotropic line broadening study of CuO is reported. X-ray powder diffraction line width modifications observed are modeled when comparing data coming from (1) commercial analytical grade CuO, (2) energetic ball milling sample for 1 h, and (3) samples prepared by thermally annealing the ball milled sample at various temperatures. X-ray powder diffraction data from commercial and produced samples were analyzed by the Rietveld method using a pseudo-Voigt function. Different assumptions including size and strain anisotropy were tried to improve pattern fitting. An anisotropic strain broadening, modeled using Stephens’ approximation, yielded the best fit, thus indicating that strain anisotropy is the main source of the departure from a smooth function of line broadening as a function of 2θ observed in all samples.

Keywords

CuOnanostructuremicrostructure anisotropy

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Type
Technical Articles
Information
Powder Diffraction , Volume 23 , Special Issue S1 , March 2008 , pp. S81 - S86
Copyright
Copyright © Cambridge University Press 2008

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