Hostname: page-component-7dd5485656-j7khd Total loading time: 0 Render date: 2025-10-31T01:35:46.840Z Has data issue: false hasContentIssue false
  • English
  • Français

A new method for Rietveld clay analysis. Part I. Use of a universal measured standard profile for Rietveld quantification of montmorillonites

Published online by Cambridge University Press:  10 January 2013

J. C. Taylor  and
C. E. Matulis
J. C. Taylor
Affiliation:
CSIRO Division of Coal and Energy Technology, Lucas Heights Research Laboratories, PMB 7, Menai, NSW, 2234, Australia
C. E. Matulis
Affiliation:
CSIRO Division of Coal and Energy Technology, Lucas Heights Research Laboratories, PMB 7, Menai, NSW, 2234, Australia
Get access Rights & Permissions [Opens in a new window]

Abstract

A new method for the quantification of montmorillonite by full-profile Rietveld analysis of the XRD profile is presented. A measured standard XRD pattern of Algerian bentonite was used to construct a universally applicable montmorillonite (hkl) file for use with a P.C. based Rietveld XRD quantitative analysis system, SIROQUANT. “Universal” means that the standard file can be used for montmorillonites from other localities. The validity of the montmorillonite standard profile was tested with weighed mixtures of quartz and different standard montmorillonites. The results show the montmorillonite observed (hkl) file is generally applicable (i.e., universal), and can be used to quantify montmorillonite in any mineral without modification or chemical treatment of the sample. Two halfwidth functions were used for the montmorillonite, corresponding to the sharp (hk0) and broad (hkl) classes of reflections. A March preferred orientation parameter for montmorillonite was also refined.

Information

Type
Research Article
Information
Powder Diffraction , Volume 9 , Issue 2 , June 1994 , pp. 119 - 123
Copyright
Copyright © Cambridge University Press 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Bethke, C. M., and Reynolds, R. C. (1983). “Calculation of Absolute Diffraction Intensities for Mixed-Layered Clays,” Clays Clay Minerals 31, 233–234.Google Scholar
Cebula, D. J., Thomas, R. K., Middleton, S., Ottewill, R. H., and White, J. W. (1979). “Neutron Diffraction from Clay-Water Systems,” Clays Clay Minerals 27, 39–52.CrossRefGoogle Scholar
Dollase, W. A. (1986). “Correction of Intensities for Preferred Orientation in Powder Diffractometry: Application of the March Model,” J. Appl. Cryst. 19, 267–272.CrossRefGoogle Scholar
Hawkins, R. K., and Egelstaff, P. A. (1980). “Interfacial Water Structure in Montmorillonite From Neutron Diffraction Experiments,” Clays Clay Minerals 28, 19–28.CrossRefGoogle Scholar
MacEwan, D. M. C. (1961). The X-Ray Identification of Crystal Structures of Clay Minerals, edited by Brown, G. (The Mineralogical Society, London), Chap. IV, pp. 143–207.Google Scholar
Maegdefrau, E., and Hofmann, U. (1937). “Kristallstruktur des Montmorillonits,” Z. Kristallog. 98, 299–323.Google Scholar
Matulis, C. E. and Taylor, J. C. (1993). “An Algorithm for Correction of Intensity Aberrations in Bragg-Brentano Diffractometer Data; its Importance in the Multiphase Full-Profile Rietveld Quantitation of a Montmorillonite Clay,” Advances X-Ray Anal. 36, 301–307.Google Scholar
Matulis, C. E., and Taylor, J. C. (1992). “Intensity Calibration Curves for Bragg-Brentano X-Ray Diffractometers,” Powder Diffr. 7, 89–95.CrossRefGoogle Scholar
Reynolds, R. C. (1980). “Interstratified Clay Minerals,” in Crystal Structures of Clay Minerals and their X-Ray Identification, edited by Brindley, G. W. and Brown, G. (Mineralogical Society, London), 495 pp.Google Scholar
Rietveld, H. M. (1969). “A Profile Refinement Method for Nuclear and Magnetic Structures,” J. Appl. Cryst., 2, 65–71.CrossRefGoogle Scholar
Smith, D. K., Johnson, G. G., Scheible, A. M., Wims, A. M., Johnson, J. L., and Ullman, G. (1987). Powder Diffr. 2, 73–77.CrossRefGoogle Scholar
Taylor, J. C. (1991). “Computer Programs for Standardless Quantitative Analysis of Minerals Using the Full Powder Diffraction Profile,” Powder Diffr. 6, 2–9.CrossRefGoogle Scholar
Taylor, J. C., and Rui, Zhu (1992). “Simultaneous Use of Observed and Calculated Standard Profiles in Quantitative XRD Analysis of Minerals by the Multiphase Rietveld Method—the Determination of Pseudorutile in Mineral Sands Products,” Powder Diffr. 7, 152–161.CrossRefGoogle Scholar
Taylor, J. C. and Aldridge, L. P. (1993). “Full-Profile Rietveld Quantitative XRD Analysis of Portland Cement: Standard XRD Profiles for the Major Phase Tricalcium Silicate (C3S:3CaO.SiO2),” Powder Diffr. 8, 138–144.CrossRefGoogle Scholar
Taylor, J. C., Rui, Zhu, and Aldridge, L. P. (1993). “Simultaneous Use of Observed and Calculated Standard Patterns in Quantitative XRD Analysis of Minerals by the Multiphase Rietveld Method: Application to Phase Quantitation of Mineral Sands and Portland Cement,” Materials Science Forum (1993) (Trans Tech Publications, Switzerland), Vols. 133–136, 329–334.Google Scholar