Hostname: page-component-7dd5485656-bvgqh Total loading time: 0 Render date: 2025-10-31T03:34:04.214Z Has data issue: false hasContentIssue false
  • English
  • Français

Reference X-Ray Diffraction Powder Patterns of Fifteen Ceramic Phases

Published online by Cambridge University Press:  10 January 2013

Winnie Wong-Ng ,
Howard F. McMurdie ,
Boris Paretzkin ,
Yuming Zhang ,
Katherine L. Davis ,
Camden R. Hubbard ,
Alan L. Dragoo  and
James M. Stewart
Winnie Wong-Ng
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, MD 20899, U.S.A.
Howard F. McMurdie
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, MD 20899, U.S.A.
Boris Paretzkin
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, MD 20899, U.S.A.
Yuming Zhang
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, MD 20899, U.S.A.
Katherine L. Davis
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, MD 20899, U.S.A.
Camden R. Hubbard
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, MD 20899, U.S.A.
Alan L. Dragoo
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, MD 20899, U.S.A.
James M. Stewart
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, MD 20899, U.S.A.
Get access Rights & Permissions [Opens in a new window]

Extract

Fifteen reference patterns of boride, silicide, selenide, telluride and oxide ceramics are reported. Included in the 15 reference patterns are data for three oxide phases which are related to high critical temperature (Tc) superconducting materials: BaCuO2, BaCuSm2O5 and BaCuYb2O5. Four other patterns are included which represent phases previously not contained in the PDF. The remaining six are major corrections of data already included in the file. Reference data for phases Ba2CuY3O6.8 and Ba2Y3CuO6 appeared in the special July superconductor issue of the Advanced Ceramic Materials, 1987. The general methods of producing these X-ray powder diffraction reference patterns are described in this journal, Vol. 1(1), 40 (1986).

Samples were mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2θ values for these internal standards are specified in the methods described (ibid.). Data were measured with a computer controlled diffractometer. The POWDER-PATTERN system of computer programs was used to locate peak positions, to calibrate the patterns, and to perform variable indexing and least-squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.

Information

Type
Research Article
Information
Powder Diffraction , Volume 2 , Issue 4 , December 1987 , pp. 257 - 265
Copyright
Copyright © Cambridge University Press 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

References

1.Kipka, R. and Muller-Buschbaum, Hk. (1977). Z. Naturforsch 32B, 121.CrossRefGoogle Scholar
1.Michel, C. and Raveau, B. (1982). J. Solid State Chem. 43, 73.Google Scholar
1.Michel, C. and Raveau, B. (1982). J. Solid State Chem. 43, 73.Google Scholar
1.Kraft, R. W. and Flinn, R. A. (1960). Trans. Am. Soc. Met. 52, 878.Google Scholar
2.Bertaut, F. and Blum, P. (1953). C. R. Hebd. Séances Acad. Sci. 236, 1055.Google Scholar
3.Guy, C. N. and Uraz, A. A. (1976). J. Less-Common Met. 48, 199.Google Scholar
1.Gebhardt, J.J. and Cree, R. F. (1965). J. Am. Ceram. Soc. 48, 262.Google Scholar
2.Glaser, F. W., Moskowitz, D., and Post, B. (1953). J. Met. 5, 1119.Google Scholar
1.Wever, F. and Moller, H. (1930). Z. Kristallogr. Kristallgeom. Kristallphys. Kristallchem. 75, 362.Google Scholar
1.Joubert, J. C. and Durif, A. (1964). Bull. Soc. Fr. Mineral. Cristallogr. 87, 48.Google Scholar
1.Paques-Ledent, M. Th. (1974). Ind. Chim. Belge. 39, 845.Google Scholar
2.Ito, Y. (1979). J. Chem. Soc. Jpn. 11, 1483.Google Scholar
1.Oftedal, I. (1927). Z. Phys. Chem. (Leipzig) 128, 135.Google Scholar
2.Yushko-Zakharova, O. (1964). Dokl. Akad. Nauk SSSR, 154, 613.Google Scholar
1.Groult, D., Hervieu, M. and Raveau, B. (1984). J. Solid State Chem. 53, 184.Google Scholar
1.Morgan, P. E. D. and Koutsoukis, M. S. (1987). Mater. Res. Bull. 22, 617.Google Scholar
2.Sato, M., Adachi, G., and Shiokawa, J. (1984). Mater. Res. Bull. 19, 1215.Google Scholar
1.Zalkin, A. and Templeton, D. H. (1953). Acta Crystallogr. 6, 269.Google Scholar
1.Etourneau, J. and Naslain, R. (1968). C. R. Seances Acad. Sci., Ser. C 266, 1452.Google Scholar
1.Roth, R. S. Priv. Commun.Google Scholar
1.Glemser, V. O., Sauer, H. and Konig, P. (1948). Z. Anorg. Chem. 257, 241.Google Scholar
2.Mentzen, B. F. and Sienko, M. J. (1976). Inorg. Chem. 15, 2198.CrossRefGoogle Scholar