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Residual stress and quantitative phase mapping on complex geometries

Published online by Cambridge University Press:  07 May 2014

Masoud Allahkarami  and
Jay C. Hanan
Masoud Allahkarami
Affiliation:
School of Mechanical and Aerospace Engineering, Oklahoma State University, Tulsa, Oklahoma 74106
Jay C. Hanan*
Affiliation:
School of Mechanical and Aerospace Engineering, Oklahoma State University, Tulsa, Oklahoma 74106
*
a)Author to whom correspondence should be addressed. Electronic mail: jay.hanan@okstate.edu
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Abstract

As a consequence of substantial advances in computer-aided design and manufacturing technology, engineering parts are no longer restricted to combination of simple geometrical shapes. Implementing complex curved surfaces in engineering components in combination with finite-element geometry optimization has become a prevalent means of designing a part. Measuring residual stresses using X-ray diffraction (XRD) on complex curved surfaces requires further development of current measurement methods. Here we investigate how a laboratory XRD system equipped with a five-axis stage and two-dimensional detector can execute sin2ψ residual stress measurements on curved surfaces. Shadowing that blocks the diffracted beam to reach the detector was avoided using proper rotations and tilting of the sample. A standard video-laser alignment system commonly used to manually place the sample in the center of diffraction was used to also generate virtual maps of the sample's curved surfaces on a fine mesh grid. The geometry was then used for setting the required rotations and tilt angles. A set of diffraction frames collected using this method on a model zirconia dental ceramic, afforded the opportunity to superimpose phase and stresses on a complex geometry. This is a step forward for the XRD technology, and its usefulness applies to many different industries.

Keywords

residual stressphase mappingcomplex geometry2D diffraction framesin2ψ methodneural network

Information

Type
Technical Articles
Information
Powder Diffraction , Volume 29 , Issue 2 , June 2014 , pp. 176 - 185
Copyright
Copyright © International Centre for Diffraction Data 2014 

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