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Rietveld texture analysis from TOF neutron diffraction data

Published online by Cambridge University Press:  29 February 2012

H.-R. Wenk ,
L. Lutterotti  and
S. C. Vogel
H.-R. Wenk*
Affiliation:
University of California, Berkeley, California 94720
L. Lutterotti
Affiliation:
University of Trento, Trento, Italy 38123
S. C. Vogel
Affiliation:
Lujan Center, LANSCE, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
*
a)Author to whom correspondence should be addressed. Electronic mail: wenk@berkeley.edu
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Abstract

One of the advantages of a multidetector neutron time-of-flight diffractometer such as the high pressure preferred orientation diffractometer (HIPPO) at the Los Alamos Neutron Science Center is the capability to measure efficiently preferred orientation of bulk materials. A routine experimental method for measurements, both at ambient conditions, as well as high or low temperatures, has been established. However, only recently has the complex data analysis been streamlined to make it straightforward for a noninitiated user. Here, we describe the Rietveld texture analysis of HIPPO data with the computer code Materials Analysis Using Diffraction (MAUD) as a step-by-step procedure and illustrate it with a metamorphic quartz rock. Postprocessing of the results is described and neutron diffraction results are compared with electron backscatter diffraction measurements on the same sample.

Keywords

texture analysisneutron diffractionRietveld methodquartzite
Type
Crystallography Education
Information
Powder Diffraction , Volume 25 , Issue 3 , September 2010 , pp. 283 - 296
Copyright
Copyright © Cambridge University Press 2010

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