Hostname: page-component-848d4c4894-ndmmz Total loading time: 0 Render date: 2024-05-22T02:25:53.765Z Has data issue: false hasContentIssue false

Standard Reference Materials For X-Ray Diffraction Part II. Calibration Using d-Spacing Standards

Published online by Cambridge University Press:  10 January 2013

W. Wong-Ng
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899
C. R. Hubbard
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899

Abstract

External standard and internal standard calibrations are important procedures for achieving high accuracy in X-ray powder diffraction studies. The theoretical basis as well as procedures for obtaining calibration curves are given. Methods and examples of selecting Standard Reference Materials (SRMs) which are produced and issued by the National Bureau of Standards (NBS), and procedures of sample preparation with these standards are also described. Three examples are presented to indicate the value of using SRMs.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Brown, A., “Optimal Calibration Curves for Guinier-type Focusing Cam-eras,” (1978). Adv. X-ray Analysis, 21, 289.CrossRefGoogle Scholar
Brown, A., Edmonds, J. W., and Foris, C. M., “Reproducibility and Precision of Measurement of Guinier Powder Patterns Using Powdered Silicon Calibrant,” (1981). Adv. X-ray Analysis, 24, 111.CrossRefGoogle Scholar
Daniels, R. W., “An Introduction to Numerical Methods and Optimization Techniques,” (1978). Elsevier North-Holland Inc., New York.Google Scholar
Dragoo, A. L., “Standard Reference Materials forX-Ray Diffraction. Part I. Overview of Current and Future Standard Reference Materials,” (1986). Powder Diffraction 1, 294.CrossRefGoogle Scholar
Edmonds, J. W., “JCPDS-International Centre for Diffraction Data Task Group on Cell Parameter Refinement,” (1986). Powder Diffraction, 1, 66.Google Scholar
Hubbard, C. R., Robbins, C. and Wong-Ng, W., “Standard Reference Material 640b, Silicon Powder X-Ray Diffraction Standard,” (1987), obtainable from the Natl. Bur. of Stand., Office of Standard Reference Materials, Gaithersburg, MD 20899. Current price will be quoted on request.Google Scholar
Hubbard, C. R., “Standard Reference Material 675, Fluorophlogopite Powder X-Ray Diffraction Standard,” (1982), to obtain, see procedure above for SRM 640b.Google Scholar
Jenkins, R., “JCPDS-International Centre for Diffraction Data. Sample Preparation Methods in X-ray Powder Diffraction,” (1986). Powder Dif-fraction, 1, (No. 2) 51.Google Scholar
Jenkins, R., “Standard Reference Materials for X-Ray Diffraction. Part III. Use of Internal and External Calibration Standards to Check Diffractometer Alignment.” Powder Diffraction, (To be published.)Google Scholar
Jenkins, R. and Hubbard, C. R., “A Preliminary Report on the Design and Results of the Second Round Robin to Evaluate Search/Match Methods for Qualitative Powder Diffractometry,” (1974). Adv. X-ray Analysis, 22, 133142.Google Scholar
Klug, H. P. and Alexander, L. E., (1974). X-Ray Diffraction Procedures, 2nd Ed., Wiley Interscience, New York.Google Scholar
McMurdie, H. F., Morris, M. C., Evans, E. H., Paretzkin, B., Wong-Ng, W. and Hubbard, C. R., “Standard X-ray Diffraction Powder Patterns from the JCPDS Research Associateship,” (1986). Powder Diffraction, 1, (No. 2) 6467.Google Scholar
McMurdie, H. F., Morris, M. C., Evans, E. H., Paretzkin, B., Wong-Ng, W. and Hubbard, C. R., (1985a). “Standard X-ray Diffraction Powder Patterns,” Natl. Bur. Stand. (U.S.) Monogr. 25, Sec. 21, 38.Google Scholar
McMurdie, H. F., Morris, M. C., Evans, E. H., Paretzkin, B., Wong-Ng, W. and Hubbard, C. R., (1985b). “Standard X-ray Diffraction Powder Patterns,” Natl. Bur. Stand. (U.S.) Monogr. 25, Sec. 21, 39.Google Scholar
McMurdie, H. F., Morris, M. C., Evans, E. H., Paretzkin, B., Wong-Ng, W. and Hubbard, C. R., “Methods of Producing Standard X-ray Diffraction Powder Patterns,” (1986). Powder Diffraction, 1, 4043.CrossRefGoogle Scholar
Morris, M. C., McMurdie, H. F., Evans, E. H., Paretzkin, B., Parker, E. H., Pyrros, N. P. and Hubbard, C. R., (1984). “Standard X-ray Diffraction Powder Patterns,” Natl. Bur. Stand. (U.S.) Monogr. 25, Sec. 20, 62.CrossRefGoogle Scholar
Pyrros, N. P., and Hubbard, C. R., (1983), “POWDER-PATTERN: A System of Programs for Processing and Interpreting Powder Diffraction Data,” Adv. X-ray Analysis, 26, 63.Google Scholar
Savitzky, A. and Golay, M. J. E., (1964), “Smoothing and Differentiation of Data by Simplified Least Squares Procedures,” Anal. Chem. 36, 1627.CrossRefGoogle Scholar
Smith, D. K., and Barrett, C. S., (1979), “Special Handling Problems in X-ray Diffractometry,” Adv. X-ray Analysis, 22, 112.Google Scholar
Smith, G. S., and Snyder, R. L., (1979), “FN: A Criterion for Rating Powder Diffraction Patterns and Evaluation of the Reliability of Powder-Pattern Indexing,” J. Appl. Cryst, 12, 6065.CrossRefGoogle Scholar
Snyder, R. L., Hubbard, C. R. and Panagiotioponlos, N. C., (1982), “A Second Generation Automated Powder Diffraction Control System,” Adv. X-ray Analysis, 25, 245260.CrossRefGoogle Scholar
Sonneveld, E. J., and Visser, J. W., (1975), “Automatic Collection of Powder Data from Photographs,”, J. Appl. Crystallogr. 8, 1.CrossRefGoogle Scholar
Steiner, J., Tremonia, Y. and Deltour, J. (1972), “Comments on Smoothing and Differentiation of Data by Simplified Least Square Procedure,” Anal. Chem., 44, 11, 19061909.Google Scholar
Wong-Ng, W., McMurdie, H. F., Paretzkin, B., Hubbard, C. R. and Dragoo, A. L., (1986). JCPDS Grants-in-Aid Project at NBS.Google Scholar