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A study of nanocrystalline yttrium oxide from diffraction-line-profile analysis: comparison of methods and crystallite growth

Published online by Cambridge University Press:  06 March 2012

D. Louër ,
T. Bataille ,
T. Roisnel  and
J. Rodriguez-Carvajal
D. Louër
Affiliation:
Laboratoire de Chimie du Solide et Inorganique Moléculaire (UMR CNRS 6511), Institut de Chimie, Université de Rennes, Avenue du Général Leclerc, 35042 Rennes Cedex, France
T. Bataille
Affiliation:
Laboratoire de Chimie du Solide et Inorganique Moléculaire (UMR CNRS 6511), Institut de Chimie, Université de Rennes, Avenue du Général Leclerc, 35042 Rennes Cedex, France
T. Roisnel
Affiliation:
Laboratoire de Chimie du Solide et Inorganique Moléculaire (UMR CNRS 6511), Institut de Chimie, Université de Rennes, Avenue du Général Leclerc, 35042 Rennes Cedex, France
J. Rodriguez-Carvajal
Affiliation:
Laboratoire Léon Brillouin (CEA-CNRS), CEA/Saclay, 91191 Gif sur Yvette cedex, France and Service de Physique Statistique, Magnétisme et Supraconductivité, CEA/Grenoble, 38054 Grenoble Cedex 9, France
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Abstract

An analysis of the microstructure of nanocrystalline yttrium oxide produced by thermal decomposition of a double oxalate yttrium and ammonium, at temperatures in the range 600 °C to 900 °C, is described. The study is based on line broadening analysis carried out with the (Voigt/Langford) integral breadth and Fourier methods combined with the pattern decomposition technique. Due to the line overlap arising from the density of diffraction lines, the whole pattern refinement method (pattern matching and Rietveld approaches) is also applied. No marked line broadening anisotropy is observed in the patterns. It is shown that for the two samples prepared at the highest temperatures the results are similar whatever the method used and the material can be considered as strain free. For the two lowest temperatures only the whole pattern refinement method is applied. The results suggest that a small amount of lattice microdistortion is present in these two last samples. It is shown that the crystallite growth varies exponentially with temperature. The results obtained from line broadening analysis are compared to those observed with scanning electron microscopy, from which a good accordance is noted between the two techniques.

Type
Technical Articles
Information
Powder Diffraction , Volume 17 , Issue 4 , December 2002 , pp. 262 - 269
Copyright
Copyright © Cambridge University Press 2002

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