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Synthesis of cerium oxide (CeO2) by co-precipitation for application as a reference material for X-ray powder diffraction peak widths

  • Anderson Márcio de Lima Batista (a1), Marcus Aurélio Ribeiro Miranda (a2), Fátima Itana Chaves Custódio Martins (a3), Cássio Morilla Santos (a2) and José Marcos Sasaki (a2)...

Abstract

Several methods can be used to obtain, from powder diffraction patterns, crystallite size and lattice strain of polycrystalline samples. Some examples are the Scherrer equation, Williamson–Hall plots, Warren/Averbach Fourier decomposition, Whole Powder Pattern Modeling, and Debye function analysis. To apply some of these methods, it is necessary to remove the contribution of the instrument to the widths of the diffraction peaks. Nowadays, one of the main samples used for this purpose is the LaB6 SRM660b commercialized by the National Institute of Standard Technology; the width of the diffraction peak of this sample is caused only by the instrumental apparatus. However, this sample can be expensive for researchers in developing countries. In this work, the authors present a simple route to obtain micron-sized polycrystalline CeO2 that have a full width at half maximum comparable with the SRM660b and therefore it can be used to remove instrumental broadening.

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a) Author to whom correspondence should be addressed. Electronic mail: andersondmlb@gmail.com

References

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Audebrand, N., Auffrédic, J. and Louër, D. (2000). “An X-ray powder diffraction study of the microstructure and growth kinetics of nanoscale crystallites obtained from hydrated cerium oxides,” Chem. Mater., 12, 17911799.
Azároff, L. V. and Buerger, M. J. (1958). The Powder Method in X-ray Crystallography (McGraw-Hill, New York).
Black, D. R., Windover, D., Henins, A., Filliben, J. and Cline, J. P. (2010). “Standard reference material 660b for X-ray metrology,” in Denver X-ray conference on Applications of X-ray Analysis, vol. 54, pp. 140148.
Braga, T. P., Dias, D. F., Sousa, M. F., Soares, J. M. and Sasaki, J. M. (2015). “Synthesis o fair stable FeCo alloy nanocrystallite by proteic sol-gel method using a rotary oven,” J. Alloys Compd. 622, 408417.
Burton, A. W., Ong, K., Rea, T. and Chan, I. Y. (2009). “On the estimation of average crystallite size of zeolites from the Scherrer equation: a critical evaluation of its application to zeolites with one-dimensional pore systems,” Microporous Mesoporous Mater. 117, 7590.
Caglioti, G., Paoletti, A., Ricci, F. P. (1958). “Choice of collimators for a crystal spectrometer for neutron diffraction,” Nuclear Instrum. 3, issue (4), 223228.
Cervellino, A., Frison, R., Bertolotti, F. and Guagliardi, A. (2015). “DEBUSSY 2.0: the new release of a Debye user system for nanocrystalline and/or disordered materials,” J. Appl. Cryst. 48, 20262032.
Courbion, G. and Ferey, G. (1988). “Na2ca3al2f14: Aa new example of a structure with ‘‘independent F-’’ – Aa new method of comparison between fluorides and oxides of different formula,” J. Solid State Chem. 76, 426431.
Degen, T., Sadki, M., Bron, E., König, U. and Nénert, G. (2014). “The highscore suite,” Powder Diffr.Powder Diffr. 29, 1318.
Gozzo, F., De Caro, L., Giannini, C., Guagliardi, A., Schmitt, B. and Prodi, A. (2006). “The instrumental resolution function of synchrotron radiation powder diffractometers in the presence of focusing optics,” J. Appl. Cryst. 39, 347353.
Guimarães, G. F., Sasaki, J. M., Sousa, J. P., Miranda, M. A. R., Carvalho, J. A., Menezes, J. W. M., and Oliveira, W. F. (2015) “Aperfeiçoamento introduzido em equipamento de estágio de rotação aplicado em forno tubular”. Brazil patent BR 10 2015 031518 0.
Hall, W. H. (1949). “X-Ray line broadening in metals,” Proc. Phys. Soc. A. 62, 741743.
Holzwarth, U. and Gibson, N. (2011). “The Scherrer equation versus the ‘Debye-Scherrer equation’,” Nat. Nanotech. 6, 534.
James, R. W. (1962). The Optical Principles of the Diffraction of X-Rrays, Vvolume II of The Crystalline State (G Bell and Sons Ltda, London).
Klug, P. and Alexander, L. E. (1974). X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials (Wiley, New York).
Langford, J. I. and Louër, D. (1996). “Powder diffraction,” Rep. Prog. Phys. 59, 131234.
Langford, J. I. and Wilson, A. J. C. (1978). “Scherrer after sixty years: a survey and some new results in the determination of crystallite size,” J. Appl. Cryst. 11, 102113.
Mikutta, R., Kleber, M., Kaiser, K., Jahn, R. (2005). “Review: organic matter removal from soils using hydrogen peroxide, sodium hypochlorite, and disodium peroxodisulfate,” Soil Sci. Soc. Am. J., 69, 120135.
Patterson, A. L. (1939). “The Scherrer formula for X-ray particle size determination,” Phys. Rev. 56, 978982.
Scardi, P., Ortolani, M. and Leoni, M. (2010). “WPPM: microstructural analysis beyond the Rietveld Method,” Mater. Sci. Forum. 651, 155171.
Tok, A. I. Y., Boey, F. Y. C., Dong, Z. and Sun, X. L. (2007) “Hydrothermal synthesis of CeO2 nano-particles,” J. Mater. Process. Technol.Journal of Materials Processing Technology, 190, 217222.
Vives, S., Gaffet, E. and Meunier, C. (2004). “X-ray diffraction line profile analysis of iron ball milled powders,” Mater. Sci. Eng., A. 366, 229238.
Wang, J., Toby, B. H., Lee, P. L., Ribaud, L., Antao, S. M., Kurtz, C., Ramanathan, M., Von Dreele, R. B. and Beno, M. A. (2008). “A dedicated powder diffraction beam line at the Advanced Photon Source: commissioning and early operational results,” Rev. Sci. Instrum., 79, 17.
Warren, B. E. and Averbach, B. L. (1950). “The effect of Cold-Work distortion on X-ray patterns,” J. Appl. Phys. 21, 595599.
Williamson, G. K. and Hall, W. H. (1953). “X-Ray line broadening from filed aluminum and wolfram,” Acta Metall.Acta Metall. 1, 2231.

Keywords

Synthesis of cerium oxide (CeO2) by co-precipitation for application as a reference material for X-ray powder diffraction peak widths

  • Anderson Márcio de Lima Batista (a1), Marcus Aurélio Ribeiro Miranda (a2), Fátima Itana Chaves Custódio Martins (a3), Cássio Morilla Santos (a2) and José Marcos Sasaki (a2)...

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