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Texture-tuned growth of CdTe thin films by closed-space sublimation technique

Published online by Cambridge University Press:  29 February 2012

Shang Fei ,
Ji-kang Jian ,
Wu Rong ,
Zheng Yu-feng  and
Sun Yan-fei
Shang Fei
Affiliation:
College of Physical Science and Technology, Xinjiang University, Urumqi, Xinjiang 830046, China
Ji-kang Jian
Affiliation:
College of Physical Science and Technology, Xinjiang University, Urumqi, Xinjiang 830046, China
Wu Rong
Affiliation:
College of Physical Science and Technology, Xinjiang University, Urumqi, Xinjiang 830046, China
Zheng Yu-feng
Affiliation:
College of Physical Science and Technology, Xinjiang University, Urumqi, Xinjiang 830046, China
Sun Yan-fei
Affiliation:
College of Physical Science and Technology, Xinjiang University, Urumqi, Xinjiang 830046, China
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Abstract

CdTe thin films were grown on indium tin oxide glass substrates by a closed-space sublimation method using a resistor heater. Crystalline structure, morphology, and band gaps of the films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), and optical absorption, respectively. The XRD analysis showed that the textures of the films were found to depend on the rate of increase in the heating current. The CdTe thin film had an (111) texture when the heating current rate was 2.0 A/min. The SEM analysis revealed that the film is composed of polyhedral grains of microns size. However, the (111) texture of the CdTe thin film observed by XRD decreased with the appearance of (220), (311), (400), (331), (422), and (511) peaks of the fcc CdTe phase when the heating current rate increased to 4.5 A/min. The (111) texture disappeared when the heating current was increased immediately from 0 A to the target current of 70 A. SEM results revealed that the grains in the film are round and the grain size is smaller than 1 μm. Optical absorption analysis showed that there is no distinctive difference in the band gaps of the films.

Keywords

CSSresistor heaterpreferred orientation
Type
Technical Articles
Information
Powder Diffraction , Volume 23 , Issue 1 , March 2008 , pp. 31 - 34
Copyright
Copyright © Cambridge University Press 2008

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