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X-Ray Powder Data for CaWO4, Synthetic Scheelite

Published online by Cambridge University Press:  10 January 2013

Frank N. Blanchard
Frank N. Blanchard
Affiliation:
Department of Geology, University of Florida, Gainesville, Florida 32611, U.S.A.
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Abstract

New X-ray powder data for CaWO4 (synthetic scheelite) are presented and compared with the current PDF patterns and with a calculated pattern.

Information

Type
Research Article
Information
Powder Diffraction , Volume 4 , Issue 4 , December 1989 , pp. 220 - 222
Copyright
Copyright © Cambridge University Press 1989

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References

Appleman, D.E. & Evans, H.T. Jr., (1973). Report PB216188. U.S. Dept. of Commerce, National Technical Information Service, 5285 Port Royal Rd., Springfield, VA 22151. Least-squares refinement of powder diffraction data. Geological Survey Contribution, Number 20.Google Scholar
Blanchard, F.N. & Palenik, G.J.Pow. Diff. 4, 21–25.Google Scholar
Blanchard, F.N.Pow. Diff. 4, 103–105.CrossRefGoogle Scholar
Garvey, R.G. (1986). Pow. Diff. 1, 114.Google Scholar
Garvey, R.G. (1988). NBS*AIDS83: Annual meeting of the International Centre for Diffraction Data, March 17, 1988, Wilmington, DE.Google Scholar
Kay, M.I., Frazer, B.C. & Almodovar, I. (1964). J. Chem. Phys. 40, 504–506.CrossRefGoogle Scholar
Mineral Powder Diffraction File (1986). Swarthmore, PA: International Centre for Diffraction Data.Google Scholar
NBS*AIDS83 (1987). Swarthmore, PA: International Centre for Diffraction Data.Google Scholar
NBS SRM 640 (1974). Silicon Powder Lattice Parameter (X-Ray Diffraction Standard). Superceded by SRM 6406, obtainable from the National Institute of Standards and Technology, Office of Standard Reference Materials.Google Scholar
Palache, C., Berman, H. & Frondel, C. (1951). Dana's System of Mineralogy, II. 7th Ed. New York: J. Wiley & Sons.Google Scholar
Smith, G.S. & Snyder, R.L. (1979). J. Appl. Crystallogr. 12, 60–65.CrossRefGoogle Scholar
Smith, D.K. & Smith, K.L. (1987). Materials Data Inc., Livermore, CA.Google Scholar
Snyder, R.L. (1983). In Adv. X-Ray Anal. 26, 1–9. New York: PlenumGoogle Scholar