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X-ray powder diffraction reference patterns for Bi1−x Pbx OCuSe

Published online by Cambridge University Press:  04 July 2016

W. Wong-Ng ,
Y. Yan ,
J.A. Kaduk  and
X.F. Tang
W. Wong-Ng*
Affiliation:
Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899
Y. Yan
Affiliation:
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan, Hubei 430070, China
J.A. Kaduk
Affiliation:
Department of Chemistry, Illinois Institute of Technology, Chicago, Illinois 60616
X.F. Tang
Affiliation:
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan, Hubei 430070, China
*
a) Author to whom correspondence should be addressed. Electronic mail: winnie.wong-ng@nist.gov
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Abstract

The structures and powder X-ray reference diffraction patterns of the “natural superlattice” series Bi1−x Pbx OCuSe (x = 0, 0.02, 0.04, 0.06, 0.08, and 0.10) have been investigated. As the ionic radius of Pb2+ is greater than that of Bi3+, the unit-cell volume of Bi1−x Pbx OCuSe increases progressively from x = 0 to 0.1, namely, from 137.868(5) to 139.172(11) Å3, as expected. The structure of Bi1−x Pbx OCuSe is built from [Bi2(1−x)Pb2x O2]2(1−x)+ layers normal to the c-axis alternating with [Cu2Se2]2(1−x)− fluorite-like layers. Pb substitution in the Bi site of Bi1−x Pbx OCuSe leads to the weakening of the “bonding” between the [Bi2(1−x)Pb2x O2]2(1−x)+ and the [Cu2Se2]2(1−x)− layers. Powder patterns of Bi1−x Pbx OCuSe were submitted to be included in the Powder Diffraction File.

Keywords

thermoelectric materialBi1−x Pbx OCuSepowder X-ray reference patternscrystal structure

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Type
Technical Articles
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Powder Diffraction , Volume 31 , Issue 3 , September 2016 , pp. 223 - 228
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Copyright © International Centre for Diffraction Data 2016 

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