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XRD study of phase transformations in lithiated graphite anodes by Rietveld method

Published online by Cambridge University Press:  09 May 2017

Alexander Missyul*
Affiliation:
Battery R&D, Samsung SDI, 130 Samsung-ro, Yeongtong-gu, Suwon 16678, South Korea ALBA Synchrotron Light Source, Carrer de la Llum 2-26, 08290, Cerdanyola del Vallès, Barcelona, Spain
Ivan Bolshakov
Affiliation:
Battery R&D, Samsung SDI, 130 Samsung-ro, Yeongtong-gu, Suwon 16678, South Korea
Roman Shpanchenko
Affiliation:
Battery R&D, Samsung SDI, 130 Samsung-ro, Yeongtong-gu, Suwon 16678, South Korea
*
a) Author to whom correspondence should be addressed. Electronic mail: amissiul@cells.es
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Abstract

Commercial anodes with different state of charge are investigated by X-ray diffraction technique using Rietveld method for data collected with standard laboratory equipment. It is shown that full profile refinement gives good approximation for quantitative description of the charge/discharge process and may be used for estimation of real state of charge (SoC). Careful analysis of the diffraction profile with Rietveld method allows us to quantitatively distinguish the contribution of different Lix C6 phases and estimate the real SoC.

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Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2017 

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