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  • Structure/property relationships
  • Properties of interest: catalytic, sorption, mechanical, gas storage, separations, energy harvesting, sensing, luminescence, energy conversion, electrical, ion conductivity, and magnetic properties
  • Scattering techniques:
    • Ambient X-ray (laboratory and synchrotron), neutron, and electron
    • In situ, in operando and non-ambient crystallography
  • Software tools for the analysis of MOFs
  • Instrumentation/techniques (combined use/multimodal) for analysis of MOFs
  • Powders, single crystals, nanomaterials, thin films
  • New materials and new crystallographic data
  • Crystallography and computational modeling
  • Nomenclature, terminology, classification scheme
  • Industrial applications
  • Vision/projection of MOFs in the coming years
Network of close D2 intermolecular close contacts in a partially displayed 1-dimensional pore of MOF-74 (Courtesy: Craig Brown).

Network of close D2 intermolecular close contacts in a partially displayed 1-dimensional pore of MOF-74 

(Courtesy: Craig Brown). 

Technical Articles estimated to be 5-8 printed pages. The papers will be either original reports of research work or an original review presenting the author’s own evaluation and analysis of recent research work and a future outlook.

 

Timeline of Publication:

 Manuscript submission Due:                                             June 30, 2018  Deadline extended to October 15, 2018!

 

Papers accepted for publication are available online via FirstView shortly after author proof final acceptance.

 

Authors Notes: 

http://www.icdd.com/resources/pdj/authors.htm

 

Submission of papers (ScholarOne):

https://mc.manuscriptcentral.c...

Editor-in-Chief

Camden Hubbard, camden.hubbard@me.com

Applied Diffraction Services

 

Managing Editor

Nicole Ernst, boris@icdd.com

ICDD

 

Guest Editors:

 Craig Brown, craig.brown@nist.gov

National Institute of Standards and Technology (NIST)

 

Winnie Wong-Ng, winnie.wong-ng@nist.gov

National Institute of Standards and Technology (NIST)