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Reducing Differential Item Functioning via Process Data

Published online by Cambridge University Press:  10 December 2025

Ling Chen
Affiliation:
Statistics, Columbia University in the City of New York , USA
Susu Zhang
Affiliation:
Psychology, University of Illinois at Urbana-Champaign , USA Statistics, University of Illinois at Urbana-Champaign, USA
Jingchen Liu*
Affiliation:
Statistics, Columbia University , USA
*
Corresponding author: Jingchen Liu; Email: jcliu@stat.columbia.edu
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Abstract

Test fairness is a major concern in psychometric and educational research. A typical approach for ensuring test fairness is through differential item functioning (DIF) analysis. DIF arises when a test item functions differently across subgroups that are typically defined by the respondents’ demographic characteristics. Most of the existing research focuses on the statistical detection of DIF, yet less attention has been given to reducing or eliminating DIF. Simultaneously, the use of computer-based assessments has become increasingly popular. The data obtained from respondents interacting with an item are recorded in computer log files and are referred to as process data. In this article, we propose a novel method within the framework of generalized linear models that leverages process data to reduce and understand DIF. Specifically, we construct a nuisance trait surrogate with the features extracted from process data. With the constructed nuisance trait, we introduce a new scoring rule that incorporates respondents’ behaviors captured through process data on top of the target latent trait. We demonstrate the efficiency of our approach through extensive simulation experiments and an application to 13 Problem Solving in Technology-Rich Environments items from the 2012 Programme for the International Assessment of Adult Competencies assessment.

Information

Type
Theory and Methods
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (https://creativecommons.org/licenses/by/4.0), which permits unrestricted re-use, distribution and reproduction, provided the original article is properly cited.
Copyright
© The Author(s), 2025. Published by Cambridge University Press on behalf of Psychometric Society
Figure 0

Figure 1 Measurement model without the intercept.

Figure 1

Figure 2 Values of the objective function before and after adding the nuisance trait surrogate for the linear model (upper) and the M2PL model (lower) with uniform DIF, $N=5{,}000$, and large DIF.

Figure 2

Table 1 Mean squared error of item parameter estimates and nuisance trait correlation for the linear model with uniform DIF under different simulation settings

Figure 3

Table 2 Mean squared error of item parameter estimates and nuisance trait correlation for the M2PL model with uniform DIF under different simulation settings. The values are averaged across the DIF items and replications

Figure 4

Figure 3 Between-group sum of squared bias for target trait estimation for the linear model (upper) and the M2PL model (lower) with uniform DIF, $N=5{,}000$, and large DIF. The x-axis corresponds to the estimation without DIF correction using the DIF items; the y-axis corresponds to the DIF-corrected estimation using the DIF items.

Figure 5

Table 3 Summary statistics of $13$ PIAAC problem-solving items

Figure 6

Figure 4 Out-of-sample prediction correlation of the process sequence length using the extracted features for each item.

Figure 7

Table 4 DIF detection results without the nuisance trait

Figure 8

Figure 5 Comparing the objective function value with and without the nuisance trait surrogate for the linear model (left) and the M2PL model (right) with one grouping variable.

Figure 9

Table 5 Sample mean Fisher information for $\theta $ with and without nuisance trait surrogate, for three grouping variables and two models

Figure 10

Figure 6 On the left: density plot of the residual nuisance trait $\widetilde {\boldsymbol \eta }$ among the “old” group and the “young” group. On the right: density plot of the residual nuisance trait $\widetilde {\boldsymbol \eta }$ among the group that used drag/drop actions and those that did not.

Figure 11

Figure A1 Geometric illustration for the proof of Proposition 1.

Figure 12

Figure B1 Objective function value before and after adding the nuisance trait surrogate for the linear model with uniform DIF under different simulation settings.

Figure 13

Figure B2 Objective function value before and after adding the nuisance trait surrogate for the M2PL model with uniform DIF under different simulation settings.

Figure 14

Figure B3 Fisher information of $\theta $ in the measurement model before and after adding the nuisance trait surrogate for the linear model with uniform DIF under different simulation settings.

Figure 15

Figure B4 Fisher information of $\theta $ in the measurement model before and after adding the nuisance trait surrogate for the M2PL model with uniform DIF under different simulation settings.

Figure 16

Figure B5 Between-group sum of squared bias for target trait estimation for the linear model with uniform DIF under different simulation settings. The x-axis corresponds to the estimation without DIF correction using the DIF items; the y-axis corresponds to the DIF-corrected estimation using the DIF items.

Figure 17

Figure B6 Between-group sum of squared bias for target trait estimation for the M2PL model with uniform DIF under different simulation settings. The x-axis corresponds to the estimation without DIF correction using the DIF items; the y-axis corresponds to the DIF-corrected estimation using the DIF items.

Figure 18

Table B1 Mean squared error of item parameter estimates and nuisance trait correlation for the linear model with non-uniform DIF under different simulation settings

Figure 19

Table B2 Mean squared error of item parameter estimates and nuisance trait correlation for the M2PL model with non-uniform DIF under different simulation settings

Figure 20

Figure B7 Objective function value before and after adding the nuisance trait surrogate for the linear model with non-uniform DIF under different simulation settings.

Figure 21

Figure B8 Objective function value before and after adding the nuisance trait surrogate for the M2PL model with non-uniform DIF under different simulation settings.

Figure 22

Figure B9 Fisher information of $\theta $ in the measurement model before and after adding the nuisance trait surrogate for the linear model with non-uniform DIF under different simulation settings.

Figure 23

Figure B10 Fisher information of $\theta $ in the measurement model before and after adding the nuisance trait surrogate for the M2PL model with non-uniform DIF under different simulation settings.

Figure 24

Figure B11 Between-group sum of squared bias for target trait estimation for the linear model with non-uniform DIF under different simulation settings. The x-axis corresponds to the estimation without DIF correction using the DIF items; the y-axis corresponds to the DIF-corrected estimation using the DIF items.

Figure 25

Figure B12 Between-group sum of squared bias for target trait estimation for the M2PL model with non-uniform DIF under different simulation settings. The x-axis corresponds to the estimation without DIF correction using the DIF items; the y-axis corresponds to the DIF-corrected estimation using the DIF items.

Figure 26

Table B3 The mean and standard deviation of the polytomous responses by group for each item

Figure 27

Table B4 The mean and standard deviation of the binary responses by group for each item

Figure 28

Figure B13 Comparing the objective function value with and without the nuisance trait surrogate for the linear (left) and the M2PL model (right) with two grouping variables.