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Reliability of Multiple Classifications

Published online by Cambridge University Press:  01 January 2025

Huynh Huynh
Huynh Huynh*
Affiliation:
University of South Carolina
*
Requests for reprints should be addressed to Huynh Huynh, College of Education, University of South Carolina, Columbia, South Carolina 29208.
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Abstract

Cohen's kappa index is reformulated for multiple classifications based on exchangeable random variables. It is found that kappa is between 0 and 1 inclusive. Two characterizations for kappa are stated in terms of the relationship between such random variables. Within the normal test score model, kappa increases with test reliability and test length. Furthermore, when based on binary classifications, kappa is an inverse U-shaped function of the cutoff score. These trends also hold for the beta-binomial test score model.

Keywords

test theorykappaexchangeabilitymastery testing

Information

Type
Original Paper
Information
Psychometrika , Volume 43 , Issue 3 , September 1978 , pp. 317 - 325
Copyright
Copyright © 1978 The Psychometric Society

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Footnotes

Paper read at the Spring meeting of the Psychometric Society, Bell Laboratories (Murray Hill, New Jersey), March 1976.

The editorial assistance and helpful comments of Leonard S. Feldt, Sarah P. Seaman-Huynh, and the three referees are gratefully acknowledged.

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