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The Baseline Metrology System of the USNO Astrometric Interferometer

Published online by Cambridge University Press:  19 July 2016

Nicholas M. Elias II  and
Donald J. Hutter
Nicholas M. Elias II
Affiliation:
United States Naval Observatory, NRL/USNO Optical Interferometer Project, AD5, 3450 Massachusetts Avenue, NW, Washington, DC 20392-5420
Donald J. Hutter
Affiliation:
United States Naval Observatory, NRL/USNO Optical Interferometer Project, AD5, 3450 Massachusetts Avenue, NW, Washington, DC 20392-5420

Abstract

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The USNO Astrometric Interferometer (USNOAI; a subarray of the Navy Prototype Optical Interferometer at Lowell Observatory) is presently under construction and expected to begin limited operations within a year. The main goal of the USNOAI observations is to provide a northern hemisphere catalog of several thousand stars with positions known to a few mas. In order to meet this requirement, a baseline laser metrology system must be employed to measure the three-dimensional motions of the baselines with an accuracy better than ~ 0.1 μm. The metrology scheme, as presently conceived, represents the largest and most complex high-resolution laser metrology system ever attempted.

Keywords

Astrometry:Optical InterferometryOptical Interferometry:Laser Metrology
Type
Instrumentation and Techniques
Information
Symposium - International Astronomical Union , Volume 158: Very High Angular Resolution Imaging , 1994 , pp. 174 - 176
Copyright
Copyright © Kluwer 1994 

References

Edlén, B.: 1966, Metrologia 2, 12 CrossRefGoogle Scholar
Hummel, C.A.: 1993, Five Years of Stellar Position Measurements with the MkIII Optical Interferometer , in The Proceedings of IAU Symposium No. 158 CrossRefGoogle Scholar
Hutter, D.J. and Hughes, J.A.: 1990, in Amplitude and Intensity Spatial Interferometry , ed. Breckinridge, J.B., Proc. SPIE 1237, 10 Google Scholar
Mozurkewich, D., Hutter, D.J., Johnston, K.J., Simon, R.S., Shao, M., Colavita, M.M., Staelin, D.H., Hines, B.E., Hershey, J.L., Hughes, J.A., and Kaplan, G.H.: 1988, AJ 95, 1269 Google Scholar
Shao, M., Colavita, M.M., Hines, B.E., Hershey, J.L., Hughes, J.A., Hutter, D.J., Kaplan, G.H., Johnston, K.J., Mozurkewich, D., Simon, R.S., Pan, X.P.: 1990, AJ 100, 1701 Google Scholar