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Effect of N+ irradiation on the microstructural and magnetic properties of Co/Pd multilayers

Published online by Cambridge University Press:  30 May 2007

A. M. Testa ,
D. Fiorani ,
M. S. Martin-Gonzalez ,
F. Briones ,
J. Montserrat  and
H. Rohrmann
A. M. Testa*
Affiliation:
ISM – CNR, Area della Ricerca di Roma, P.B. 10, 00016 Monterotondo Stazione, Rome, Italy
D. Fiorani
Affiliation:
ISM – CNR, Area della Ricerca di Roma, P.B. 10, 00016 Monterotondo Stazione, Rome, Italy
M. S. Martin-Gonzalez
Affiliation:
Instituto de Microelectrónica de Madrid, IMM (CNM-CSIC) C/Isaac Newton, 8 (PTM) 28760 - Tres Cantos, Madrid, Spain
F. Briones
Affiliation:
Instituto de Microelectrónica de Madrid, IMM (CNM-CSIC) C/Isaac Newton, 8 (PTM) 28760 - Tres Cantos, Madrid, Spain
J. Montserrat
Affiliation:
Institut de Microelectrònica Barcelona, Campus Universitat Autònoma Barcelona, 08193, Bellaterra, Spain
H. Rohrmann
Affiliation:
UNAXIS Data Storage, 9496 Balzers, Liechtenstein
*
albertomaria.testa@ism.cnr.it
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Abstract

Microstructural and magnetic properties of 14N+ irradiated Co/Pd multilayers, deposited on ultra-flat large (2.5 in) glass substrates by a special hard disk industrial manufacturing system, are discussed. Upon irradiation with 14N+ ions at different energies (20–30 keV) and doses (1014–1015 ions/cm2), both the coercive and nucleation fields were found to change with respect to as deposited multilayer. Results indicate that the irradiation process leads to a lowering of the magnetic anisotropy due to the induced disorder and degradation of the interface quality: for an energy of 30 keV, at an irradiation level of 1015 ions/cm2, Hc reduces from Hc≈ 5.4 kOe for the as deposited multilayer down to 300 Oe, being the easy axis still perpendicular to the multilayer plane; at the highest dose (1016 ions/cm2), the coercivity vanishes and the perpendicular anisotropy is suppressed.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 38 , Issue 3 , June 2007 , pp. 253 - 258
Copyright
© EDP Sciences, 2007

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