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RDS and IRDS filters for fast CCD video sensors

Published online by Cambridge University Press:  15 February 1999

N. Hassen
Affiliation:
Faculté des Sciences, avenue de l'Environnement, 5000 Monastir, Tunisia
M. Jung
Affiliation:
Groupe d'Optique Appliquée, B.P. 28, 67037 Strasbourg Cedex 2, France
B. Cunin
Affiliation:
Groupe d'Optique Appliquée, B.P. 28, 67037 Strasbourg Cedex 2, France
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Abstract

In this paper we present two filters called Reflection Delayed noise Suppression RDS and Integration Reflection Delayed noise Suppression IRDS whichare useful to increase the dynamics of video CCD cameras. The RDS is a band-passfilter built with a parallel short-circuited line. It lowers significantly the mostimportant noise which is called reset noise. Unfortunately, this signal processingunit increases the contribution of thermal fluctuations by about 3 dB. To overcomethis disadvantage, a triggered low-pass filter can be added to the RDS which leadsto the IRDS cell. First, we will describe both systems, and then we will comparetheir effects, in a theoretical way and by experimentation, on the unsampled noises (i.e. the thermal and flicker noises) generated in the CCD sensor.

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Type
Research Article
Copyright
© EDP Sciences, 1999

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References

W.H. White et al., IEEE J. Sol. Stat. Circ. SC 9, 1 (1974).
M. Ohbo et al., IEEE Trans. Cons. Electron. 35 (1989).
N. Hassen, Ph.D. thesis, University Louis-Pasteur, Strasbourg, 1995.
M. Jung et al., QCAV'97 International Conference on Quality Control by Artificial Vision, Le Creusot, France, (1997).
Y. Nishida et al., IEEE Trans. Electron Dev. 36 (1989).
J. Hynecek, in IEEE Trans. Electron Dev. 37, 3 (1992).