Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM

K. Suenaga; Y. Iizumi; T. Okazaki

doi:10.1051/epjap/2011100414

Abstract

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Imaging and chemical analysis of individual metallofullerene molecules were successfully carried out without massive destruction using a scanning transmission electron microscope (STEM) operated at 30 kV. Electron energy-loss spectroscopy (EELS) unambiguously identified the constituent atom of each metallofullerene molecule. The profile of EELS chemical map measured across the single atom provides a rough estimate of EELS signal delocalization, which is considerably reduced using accelerating voltage as low as 30 kV.

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Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM

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This article has been cited by the following publications. This list is generated based on data provided by Crossref.

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Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM

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