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Tuning the mapping of second-harmonic generation in silver nanoshells

Published online by Cambridge University Press:  28 September 2011

Z.J. Li ,
S.Y. Gao  and
D. Han
Z.J. Li*
Affiliation:
School of Biomedical Engineering, Southern Medical University, Guangzhou 510515, P.R. China
S.Y. Gao*
Affiliation:
Department of Applied Physics, MOE Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, Xi’an Jiaotong University, Xi’an 710049, P.R. China
D. Han
Affiliation:
Department of Applied Physics, MOE Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, Xi’an Jiaotong University, Xi’an 710049, P.R. China
*
ae-mail: lee0720@fimmu.com
be-mail: gaosy@mail.xjtu.edu.cn
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Abstract

The distribution patterns of the second-harmonic generation (SHG) enhancement factor in the incident plane of silver nanoshell at resonance frequencies have been studied by using electrostatic approximation. The mapping feature of SHG corresponding to double frequency local field enhancement is different from that of fundamental case. At longer wavelength (SHG enhancement resulting from local field at double frequency), large SHG enhancements are only observed outside the shell. However, hot spots also take place inside the silver shell at shorter wavelength (SHG enhancement resulting from local field at fundamental frequency). The effect of outer surrounding media on the SHG corresponding to local field at fundamental frequency is also very different from that of double frequency. It has been found that the azimuth angle dependent SHG at shorter wavelength split into two maximums when the surrounding dielectric constant is increased, which is absent for SHG at longer wavelength.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 56 , Issue 1: Topical Issue: 5th Colloquium Interdisciplinary in Instrumentation (C2I) 2010 , October 2011 , 10404
Copyright
© EDP Sciences, 2011

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References

Butet, J., Duboisset, J., Bachelier, G., Russier-Antoine, I., Benichou, E., Jonin, C., Brevet, P.F., Nano Lett. 10, 1717 (2010)CrossRef
Lesuffleur, A., Gogol, P., Beauvillain, P., Guizal, B., Van Labeke, D., Georges, P., J. Appl. Phys. 104, 124310 (2008)CrossRef
Onuta, T.D., Waegele, M., DuFort, C.C., Schaich, W.L., Dragnea, B., Nano Lett. 7, 557 (2007)CrossRef
Iliopoulos, K., Krupka, O., Gindre, D., Sallé, M., J. Am. Chem. Soc. 132, 14343 (2010)CrossRef
Bachelier, G., Russier-Antoine, I., Benichou, E., Jonin, C., Brevet, P.F., J. Opt. Soc. Am. B 25, 955 (2008)CrossRef
Zhu, J., Nanotechnology 18, 225702 (2007)CrossRef
McMahon, M.D., Lopez, R., Haglund, R.F., Ray, E.A., Bunton, P.H., Phys. Rev. B 73, 041401 (2006)CrossRef
Pu, Y., Grange, R., Hsieh, C.L., Psaltis, D., Phys. Rev. Lett. 104, 207402 (2010)CrossRef
Lu, H., Liu, X., Zhou, R., Gong, Y., Mao, D., Appl. Opt. 49, 2347 (2010)CrossRef
Canfield, B.K., Husu, H., Laukkanen, J., Bai, B., Kuittinen, M., Turunen, J., Kauranen, M., Nano Lett. 7, 1251 (2007)CrossRef
Schelm, S., Smith, G.B., J. Phys. Chem. B 109, 1689 (2005)CrossRef
Perenboom, J.A.A.J., Wyder, P., Meier, F., Phys. Rep. 78, 173 (1981)CrossRef
Averitt, R.D., Westcott, S.L., Halas, N.J., J. Opt. Soc. Am. B 16, 1824 (1999)CrossRef
Chen, C.K., De Castro, A.R.B., Shen, Y.R., Phys. Rev. Lett. 46, 145 (1981)CrossRef
Sandrock, M.L., Pibel, C.D., Geiger, F.M., Foss, C.A., J. Phys. Chem. B 103, 2668 (1999)CrossRef
Addison, C.J., Konorov, S.O., Brolo, A.G., Blades, M.W., Turner, R.F.B., J. Phys. Chem. C 113, 3586 (2009)CrossRef
Prodan, E., Radlo, C., Halas, N.J., Nordlander, P., Science 302, 419 (2003)CrossRef
Canfield, B.K., Kujala, S., Jefimovs, K., Vallius, T., Turunen, J., Kauranen, M., Opt. A: Pure Appl. Opt. 7, S110 (2005)CrossRef
Zavelani-Rossi, M., Celebrano, M., Biagioni, P., Polli, D., Finazzi, M., Duò, L., Cerullo, G., Labardi, M., Allegrini, M., Grand, J., Adam, P.M., Appl. Phys. Lett. 92, 093119 (2008)CrossRef
Schön, P., Bonod, N., Devaux, E., Wenger, J., Rigneault, H., Ebbesen, T.W., Brasselet, S., Opt. Lett. 35, 4063 (2010)CrossRef