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Crystal chemistry, X-ray diffraction reference patterns, and bandgap studies for (BaxSr1-x)2CoWO6 (x = 0.1, 0.2, 0.3, 0.5, 0.7, and 0.9) - CORRIGENDUM

Published online by Cambridge University Press:  12 April 2021

W. Wong-Ng ,
G. Y. Liu ,
D. D. Shi ,
Y. Q. Yang ,
R. Derbeshi ,
D. Windover  and
J. A. Kaduk
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Abstract

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Type
Corrigendum
Information
Powder Diffraction , Volume 36 , Issue 3 , September 2021 , pp. 217
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Copyright
Copyright © International Centre for Diffraction Data, 2021

In Wong-Ng et al. (Reference Wong-Ng, Liu, Shi, Yang, Derbeshi, Windover and Kaduk2020), the last sentence of the first paragraph on page 198 was incorrect.

The sentence should read “Additionally, the reference X-ray diffraction (XRD) patterns for (BaxSr1–x)2CoWO6 (x = 0.2 and 0.7) are measured to make them available as references through submission to the Powder Diffraction File as PDF Numbers 00-66-0546, 00-66-0547, 00-66-0548, 00-66-0549, 00-66-0550 and 00-69-0487 (Gates-Rector and Blanton, 2019)”.

Additionally, the reference (PDF, 2019) should be:

Gates-Rector, S. D. and Blanton, T. N., (2019). “The Powder Diffraction File: A Quality Materials Characterization Database,” Powder Diffr. 34, 352–360.

References

Wong-Ng, W., Liu, G. Y., Shi, D. D., Yang, Y. Q., Derbeshi, R., Windover, D., and Kaduk, J. A. (2020). “Crystal chemistry, X-ray diffraction reference patterns, and bandgap studies for (BaxSr1-x)2CoWO6 (x = 0.1, 0.2, 0.3, 0.5, 0.7, and 0.9),” Powder Diffr. 35, 197–205. doi:10.1017/S0885715620000342.CrossRefGoogle Scholar