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A Bayesian Generalized Explanatory Item Response Model to Account for Learning During the Test

Published online by Cambridge University Press:  01 January 2025

José H. Lozano*
Affiliation:
Universidad Autónoma de Madrid
Javier Revuelta
Affiliation:
Universidad Autónoma de Madrid
*
Correspondence should be made to José H. Lozano, Universidad Autónoma de Madrid, Madrid, Spain. Email: joseh.lozano@uam.es
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Abstract

The present paper introduces a new explanatory item response model to account for the learning that takes place during a psychometric test due to the repeated use of the operations involved in the items. The proposed model is an extension of the operation-specific learning model (Fischer and Formann in Appl Psychol Meas 6:397–416, 1982; Scheiblechner in Z für Exp Angew Psychol 19:476–506, 1972; Spada in Spada and Kempf (eds.) Structural models of thinking and learning, Huber, Bern, Germany, pp 227–262, 1977). The paper discusses special cases of the model, which, together with the general formulation, differ in the type of response in which the model states that learning occurs: (1) correct and incorrect responses equally (non-contingent learning); (2) correct responses only (contingent learning); and (3) correct and incorrect responses to a different extent (differential contingent learning). A Bayesian framework is adopted for model estimation and evaluation. A simulation study is conducted to examine the performance of the estimation and evaluation methods in recovering the true parameters and selecting the true model. Finally, an empirical study is presented to illustrate the applicability of the model to detect learning effects using real data.

Information

Type
Theory and Methods (T&M)
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Copyright
Copyright © 2021 The Author(s)
Figure 0

Table 1. Average posterior predictive p-value (PPP¯\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$\overline{\mathrm {PPP}}$$\end{document}) and empirical proportion of rejections (EPR) of the discrepancy statistics for each combination of generating model and fitted model

Figure 1

Table 2. Average WAIC and LOOIC (Mean) and empirical proportion of selections (EPS) for each combination of generating model and fitted model

Figure 2

Table 3. Standard error (SE), bias, and root-mean-square error (RMSE) for each combination of estimated parameter, generating model, and fitted model

Figure 3

Table 4. Transposed weight matrix for the fraction-subtraction items (de la Torre, 2009)

Figure 4

Table 5. Model evaluation statistics at the test level for the fitted models

Figure 5

Table 6. Odds-ratio at the item level for the fitted models

Figure 6

Table 7. Bayesian latent residuals at the item level for the fitted models

Figure 7

Table 8. Comparison indices for the fitted models

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Table 9. Expected a posteriori (EAP) estimates, posterior standard deviations (SD), and posterior probability intervals (2.5%-97.5%\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$2.5\%-97.5\%$$\end{document}) of the difficulty (αm\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$\alpha _m$$\end{document}) and practice parameters (δm\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$\delta _m$$\end{document} and γm\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$\gamma _m$$\end{document}) of the operation-specific differential contingent learning model

Figure 9

Table 10. Expected a posteriori (EAP) estimates, posterior standard deviations (SD), and posterior probability intervals (2.5%-97.5%\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$2.5\%-97.5\%$$\end{document}) of the differences (dm\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$d_m$$\end{document}) by operation (m) between the practice parameters (δm\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$\delta _m$$\end{document} and γm\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$\gamma _m$$\end{document}) of the operation-specific differential contingent learning model

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Figure 1. Difficulty of the five cognitive operations as a function of previous practice for subjects i=1\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$i = 1$$\end{document} (left) and i=2\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$i = 2$$\end{document} (right)

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