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Modelling and peeling extended sources with shapelets: A Fornax A case study

Published online by Cambridge University Press:  16 July 2020

J. L. B. Line*
Affiliation:
International Centre for Radio Astronomy Research, Curtin University, Perth, WA6845, Australia ARC Centre of Excellence for All Sky Astrophysics in 3 Dimensions (ASTRO-3D)
D. A. Mitchell
Affiliation:
CSIRO Astronomy and Space Science (CASS), PO Box 76, Epping, NSW1710, Australia
B. Pindor
Affiliation:
ARC Centre of Excellence for All Sky Astrophysics in 3 Dimensions (ASTRO-3D) The University of Melbourne, School of Physics, Parkville, VIC3010, Australia
J. L. Riding
Affiliation:
ARC Centre of Excellence for All Sky Astrophysics in 3 Dimensions (ASTRO-3D) The University of Melbourne, School of Physics, Parkville, VIC3010, Australia
B. McKinley
Affiliation:
International Centre for Radio Astronomy Research, Curtin University, Perth, WA6845, Australia ARC Centre of Excellence for All Sky Astrophysics in 3 Dimensions (ASTRO-3D)
R. L. Webster
Affiliation:
ARC Centre of Excellence for All Sky Astrophysics in 3 Dimensions (ASTRO-3D) The University of Melbourne, School of Physics, Parkville, VIC3010, Australia
C. M. Trott
Affiliation:
International Centre for Radio Astronomy Research, Curtin University, Perth, WA6845, Australia ARC Centre of Excellence for All Sky Astrophysics in 3 Dimensions (ASTRO-3D)
N. Hurley-Walker
Affiliation:
International Centre for Radio Astronomy Research, Curtin University, Perth, WA6845, Australia ARC Centre of Excellence for All Sky Astrophysics in 3 Dimensions (ASTRO-3D)
A. R. Offringa
Affiliation:
Netherlands Institute for Radio Astronomy (ASTRON), 7991 PDDwingeloo, The Netherlands
*
Author for correspondence: Jack Laurence Bramble Line, E-mail: jack.line@curtin.edu.au
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Abstract

To make a power spectrum (PS) detection of the 21-cm signal from the Epoch of Reionisation (EoR), one must avoid/subtract bright foreground sources. Sources such as Fornax A present a modelling challenge due to spatial structures spanning from arc seconds up to a degree. We compare modelling with multi-scale (MS) CLEAN components to ‘shapelets’, an alternative set of basis functions. We introduce a new image-based shapelet modelling package, SHAMFI. We also introduce a new CUDA simulation code (WODEN) to generate point source, Gaussian, and shapelet components into visibilities. We test performance by modelling a simulation of Fornax A, peeling the model from simulated visibilities, and producing a residual PS. We find the shapelet method consistently subtracts large-angular-scale emission well, even when the angular resolution of the data is changed. We find that when increasing the angular resolution of the data, the MS CLEAN model worsens at large angular scales. When testing on real Murchison Widefield Array data, the expected improvement is not seen in real data because of the other dominating systematics still present. Through further simulation, we find the expected differences to be lower than obtainable through current processing pipelines. We conclude shapelets are worthwhile for subtracting extended galaxies, and may prove essential for an EoR detection in the future, once other systematics have been addressed.

Information

Type
Research Article
Copyright
Copyright © Astronomical Society of Australia 2020; published by Cambridge University Press
Figure 0

Figure 1. Upper panel: Fornax A image obtained from NED, which includes CLEAN residuals around the edge of the lobes. Over-plotted in red is a boundary line outside of which a Gaussian taper was applied to create the model used in WODEN. Lower panel: The image after applying the taper and transforming from B1950 to J2000 centred coordinates. Any pixels that were not masked (the grey region) in the lower image were converted into point sources.

Figure 1

Figure 2. MS CLEANed images of the WODEN simulation of Fornax A. Top: All Phase I configuration, imaged with briggs 0 weighing to balance the large number of short baselines present in Phase I data with a reasonable resolution. Bottom: A combination of both Phase I and Phase II configurations. These are imaged with uniform weighing to take advantage of the higher resolution Phase II data.

Figure 2

Figure 3. Left: Example of initial Gaussian fit used to set $\phi_{\text{PA}}$ of the basis functions for one of the simulated Phase 1+2 lobe images. The red line shows the FWHM, with the white lines demonstrating the PA found. Right: Example of the grid-based approach for fitting $\beta_1$ and $\beta_2$. The colour scale here represents the residuals in (Jy/pixel)$^2$ left after fitting the image in the left panel with all basis functions up to $p_{\text{max}} = 86$.

Figure 3

Figure 4. Left: MS CLEANed Phase 1 simulated data Middle: Fitted shapelet model recreated in image space, using restoring beam convolved basis functions Right: The model subtracted from the data. The footprints of the two separate shapelet models (one for each lobe) are clearly visible in the residual plot.

Figure 4

Figure 5. Simulated peeling results. Plots (a) to (d) show MS CLEANed peel residuals of an integration over the full bandwidth and time span of a single simulated Phase 1 observation, each peeled with a different model for Fornax A. The models are: (a) a shapelet model from Phase I data; (b) a shapelet model from Phase 1 and 2 data; (c) an MS CLEAN model from Phase I data; (d) an MS CLEAN model from Phase I and II data. A contour plot of the unpeeled power is shown on each plot as a angular scale reference. Plot (f) shows the 1D PS as estimated with CHIPS for the models in (a) to (d). For reference, the power without peeling is shown for the unpeeled WODEN simulation in (e). The line style and marker for each 1D PS plotted in (f) is also plotted in each plot from (a) to (d) on the lower right for reference.

Figure 5

Figure 6. The 2D PS as estimated by CHIPS of the simulated peeling results. Plots (a) and (b) show the shapelet model peel results for Phase I and Phase I + II, with (c) showing the difference between the 2D PS in (a) and (b). The MS CLEAN peel results are shown in a similar manner in plots (d), (e), and (f). In the difference PS of (c) and (f), blue means the Phase I model subtracted less power than the Phase I + II model, and red means the Phase I model subtracted more power.

Figure 6

Figure 7. Results from compressing the MS CLEAN and shapelet models. Plots (a), (b), and (c) on the left show results from Phase I models, where (d), (e), and (f) on the right show results from Phase I + II models. The top row show residual 1D PS left after peeling MS CLEAN models (a) and (d) and shapelet models (b) and (e), at various levels of truncation. The percentage in the legend is the percentage of remaining components after truncation. We take slices through the truncation results at specific low k values, shown by the vertical dotted lines, and plot them as a function of GPU time in the bottom row (c) and (f). In both plots, dashed lines are MS CLEAN, and solid lines are shapelet results. Matching colours plot matching k-modes.

Figure 7

Figure 8. Stages of fitting for the Fornax A image using real MWA data as described in Section 6.1 and shown in (a). Four compact sources (outlined in red circles) were found through trial and error to cause fitting problems, and so were subtracted as Gaussians. The image was then split into two lobes, (b) and (c), and fitted separately. (d) shows the fitted shapelet model recreated in image space, using restoring beam convolved basis functions, as well as the subtracted Gaussians. (e) shows the fitting residuals.

Figure 8

Table 1. Observational parameters of the real data used to test peeling.

Figure 9

Figure 9. Real data peel results for Fornax A data detailed in Table 1: (a) the calibrated data before subtraction; (b) and (c) the residuals after peeling the shapelet model and MS CLEAN model, respectively; (d) and (e) the 2D PS of the residuals after peeling the shapelet model and MS CLEAN model, respectively; (f) the difference between the two 2D PS shown in (d) and (e), with the MS CLEAN PS subtracted from the shapelet PS. In (f), red means the shapelet model subtracted more power during the peel, and blue means the MS CLEAN model subtracted more.

Figure 10

Figure 10. Real data peel results for the EoR1 data detailed in Table 1: (a) and (b) the new Phase I + II shapelet model simulated using the RTS and the residuals after peeling with this model, respectively; (c) and (d) the old shapelet model and residuals after peeling, respectively; (e) an east-west polarisation difference 2D PS where the residuals of (d) (old shapelets) are subtracted from (b) (new shapelets); (f) 1D PS of the residuals left behind after peeling the new shapelet mode (blue line with squares) and the old model (orange with triangles), with an estimate of the thermal noise in the east-west polarisation; (g) the ratio of the 1D PS shown in (f), with the new model divide by the old model. In (e), red means the new model subtracted more power during the peel, and blue means the old model subtracted more. We only show east-west here, but the north-south display the same behaviour.

Figure 11

Figure 11. Residual 1D PS comparing peeling 1 000 simulated sources, including the new Fornax A MS CLEAN model, when peeling sources including the new shapelet model (blue with squares) and including the old shapelet model (orange with triangles).