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Dielectric Properties of Dislocation-free Ice

Published online by Cambridge University Press:  30 January 2017

Kazuhiko Itagaki*
Affiliation:
U.S. Army Cold Regions Research and Engineering Laboratory, Hanover, New Hampshire 03755, U.S.A.
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Abstract

Dielectric properties of dislocation-free hoar-frost ice crystals were measured in the audio-frequency range. Anomalously small relaxation strength was found in the dislocation-free area of the crystal samples while dislocations deliberately introduced by scratching the samples drastically modified the relaxation strength. Since measurements made in the area of high dislocation density indicated normal behavior, electrically charged dislocations are considered to be the source of the normally observed dielectric relaxation.

Résumé

Résumé

Les propriétés diélectriques de cristaux de glace sans dislocation obtenus par croissance à partir de phase vapeur ont été déterminées dans le domain d’audio-fréquence. Nous avons observé un effet de relaxation anormalement faible dans le cas d’échantillons sans dislocation alors que l’introduction volontaire de dislocations provoquée en grattant l’éprouvette, modifie fortement cet effet de relaxation. Etant donné qua les mesures faites dans les cas où la densité de dislocation est élevée indiquant un comportement normal, nous pensons que les dislocations chargées électriquement sont à l’origine de la relaxation diélectrique habituellement observée.

Zusammenfassung

Zusammenfassung

Die dielektrischen Eigenschaften von versetzungsfreien Reifkristallen wurden im kHz-Bereich gemessen. In dem versetzungsfreien Bereich der Kristallproben wurde eine ungewöhnlich kleine Relaxation gefunden, dagegen veränderten Versetzungen, die durch Kratzen an den Proben absichtlich eingeführt wurden, die Relaxation entscheidend. Da Messungen, die im Bereich hoher Versetzungsdichte vorgenommen wurden, gewöhnliches Verhalten anzeigten, sind elektrisch geladene Versetzungen die Quelle der üblicherweise beobachteten dielektrischen Relaxation.

Information

Type
Research Article
Copyright
Copyright © International Glaciological Society 1978
Figure 0

Fig. 1. X-ray topogram of vapor-grown (hoar-frost) ice crystal. Differences in thickness make the parallel lines. Dielectric relaxation was measured in the dislocation-free area in the circle before and after scratching. Length of diffraction vector (arrow) is 1 mm.

Figure 1

Fig. 2. Schematic diagram of electrode system.

Figure 2

Fig. 3. Frequency versus real (C′) and imaginary (C″) parts of capacitance before (M 20/6) and after (M 20/7) scratching.

Figure 3

Fig. 4. Cole–Cole plot of the data from M 20/6, M 20/7, and M 21/1, assuming that the dielectric permittivity for 100 kHz is 3.2.

Figure 4

Table I. Data with κ0 smaller than 10

Figure 5

Fig. 5. X-ray topogram of crystal with high dislocation density. Dielectric relaxation of the circled portion is shown in Figure 6. Length of diffraction vector (arrow) is 1 mm.

Figure 6

Fig. 6. Frequency, versus C′, C″ of area with high dislocation density (M 21/1, solid lines) compared with the dislocation-free area (M 20/6, dashed lines).

Figure 7

Fig. 7. X-ray topogram of hoar frost with some dislocation (A) and dislocation-free (B) areas. Length of diffraction vector (arrow) is 1 mm.

Figure 8

Fig. 8. Frequency versus C′ and C″ of dislocation free area (dashed line) in the circle B shown in Figure 7 (M 24/2) are compared with that of the area A with some dislocations (solid line) (M 24/1).

Figure 9

Fig. 9. Cole–Cole plots of M 24/1 and M 24/2 indicate the drastic modification of the dielectric relaxation spectra by a small number of dislocations. Relaxation time τ and static dielectric permittivity κ0′ are calculated for the higher frequency range of the relaxation spectrum.

Figure 10

Fig. A.1. How the single-crystal block was sliced into five slabs after about 10% shear creep.

Figure 11

Fig. A.2. Charge generation of slabs A–E of Figure A.1 by shear stress.