Hostname: page-component-6766d58669-bkrcr Total loading time: 0 Render date: 2026-05-16T09:55:00.547Z Has data issue: false hasContentIssue false

Single-atom fabrication with electron and ion beams: From surfaces and two-dimensional materials toward three-dimensional atom-by-atom assembly

Published online by Cambridge University Press:  08 September 2017

Sergei V. Kalinin
Affiliation:
Institute for Functional Imaging of Materials; and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, USA; sergei2@ornl.gov
Stephen J. Pennycook
Affiliation:
Department of Materials Science and Engineering, National University of Singapore, Singapore; The University of Tennessee, USA; and Vanderbilt University, USA; steve.pennycook@nus.edu.sg; or msepsj@nus.edu.sg

Abstract

The two current reigning paradigms enabling nanotechnology are scanning probe microscopy and molecular machine devices that date back to seminal experiments by Eigler and visionary work by Drexler, respectively. The nanoscience and nanotechnology community is seeing the emergence of a third paradigm—the use of the atomically focused beam of a scanning transmission electron microscope (STEM) to control and direct matter on the atomic scale. Beam-induced modifications involving one atom or a small group of atoms can be induced and monitored in real time with atomic resolution. Combined with the development of beam-control electronics, big data acquisition, and analytical tools such as artificial intelligence-based feedback systems, electron and ion microscopies are at the brink of a transition from purely imaging tools to tools capable of creating structures with atomic precision and high throughput. In this issue of MRS Bulletin, we present recent advances in electron- and ion-beam-based atomic fabrication on surfaces, in layered materials, and finally in three dimensions—the ultimate dream and possibly the final frontier of nanoscience.

Information

Type
Introduction
Copyright
Copyright © Materials Research Society 2017 
Figure 0

Figure 1. (a) Google Ngram search showing the growing frequency of the words “nanotechnology” and “nanoscience” in online books. (b) Number of publications per year on “electron microscopy” and (keyword), according to ISI.

Figure 1

Figure 2. Examples of single-atom manipulation with scanning probes. (a) Xenon atoms on nickel(110) surface forming “IBM.” Image originally created by IBM Corporation. (b) Carbon monoxide man on platinum(111). Image originally created by IBM Corporation. (c) Scanning tunneling micrograph of a four-wheeled “nanocar” on a Au(111) surface. Adapted with permission from Reference 33. © 2005 American Chemical Society. (d) Quantum corral, iron on copper(111). Image originally created by IBM Corporation. (e) Single-atom transistor with a single Si atom. Note: S, source; D, drain. Reprinted with permission from Reference 34. © 2012 Nature Publishing Group. (f) Nb and Al circuits on a Si substrate, forming a multiple-qubit device. Reprinted with permission from Reference 35. © 2015 Nature Publishing Group.

Figure 2

Table I. Atomistic and nanoscale beam-induced phenomena.

Figure 3

Figure 3. Examples of the electron-beam- and ion-beam-induced changes in materials structure resolved at atomic or near-atomic level. (a) Sculpting: scanning electron microscope images before and after straightening carbon nanotubes by Ar ion irradiation. Reprinted with permission from Reference 70. © 2003 Elsevier. (b) Crystallization/amorphization: structural changes of Sr2Nd8(SiO4)6O2 under electron irradiation. Reprinted with permission from Reference 60. © 2007 AIP Publishing. (c) Phase transitions: phase transition from γ-CaSo4 to β-CaSo4. Adapted with permission from Reference 71. © 2015 American Chemical Society. (d) Atomic column rearrangement: annular dark-field images showing phase front advancement in transition from Mn3O4 to MnO.72 (e) Domain switching: electron-beam-induced domain switching in Rb-doped KTiOPO4. Reprinted with permission from Reference 62. © 2016 American Physical Society. (f) Bond formation: experimental (right) and simulated (left) images of bond formation in perchlorocoronene under electron-beam irradiation. Adapted with permission from Reference 73. © 2017 American Chemical Society. (g) Vacancy formation in graphene sheet after irradiation by a focused electron beam. Adapted with permission from Reference 74. © 2012 Macmillan Publishers Ltd. (h) Vacancy ordering in SrCoO2.7. Reprinted with permission from Reference 75. (i) Atomic motion: movement of Ce dopant laterally within wurtzite-type aluminum nitride.76

Figure 4

Figure 4. Examples of electron-beam-based fabrication. (a) Scanning transmission electron microscope image of a nanoscale topographic map of the world drawn using electron-beam-induced deposition and a tungsten precursor. Adapted with permission from Reference 77. © 2008 World Scientific. (b) Aberration-corrected electron-beam lithography in poly(methyl methacrylate).78 (c) IFIM. (d) Text “ORNL” patterned on the interface of amorphous and crystalline SrTiO3.79