As a materials scientist who not only uses transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) for materials characterization, but also teaches classes on electron microscopy, I enjoyed reading this book. It covers a wide range of applications, from basics on electron microscopy and diffraction, to more advanced, newly developed techniques for imaging and diffraction. The book is divided into three parts: Part I covers nano-imaging in TEM mode, Part II covers nano-imaging in STEM mode, and Part III contains a series of appendices with background theory on imaging and diffraction.
The first three chapters focus on basics of imaging and diffraction, with an emphasis on the concepts of imaging in TEM mode compared to an optical (light) microscope, while the appendices have more rigorous math on Fourier transforms and image formation with electromagnetic lenses and the role of aberrations. Chapters 4–7 cover resolution, high-resolution lattice imaging, and the effects of lens aberrations and voltage instabilities.
Chapter 8 describes several advanced imaging techniques, starting with the physics of electron energy-loss spectroscopy and the use of this technique in imaging by energy-filtered TEM. This chapter also describes electron tomography to obtain 3D reconstruction images from a series of images taken from the same area of a sample but at different angles.
Part II describes imaging in STEM mode with a detailed comparison to a scanning electron microscope (SEM). Chapters 9–11 describe image formation in STEM by the scanning of a small spot of the electron beam over an area of the sample. These chapters also present image contrast in STEM and the difference between bright-field STEM and annular dark-field STEM. Chapter 12 presents imaging theory in STEM.
Chapter 13 gives a good outlook for the future in TEM and STEM. The main objectives are to increase beam brightness and decrease aberrations of the lenses used to converge the electron beam. This chapter also describes current attempts for correction of chromatic aberration being developed and presents a bright future for elemental mapping and analytical microscopy with even higher resolution, both spatially and in energy.
Part III (chapters 15–31) describes the theory of imaging with electro-magnetic lenses, the application of Fourier optics to electromagnetic lenses, contrast transfer function, lens aberration, and image processing methods, as well as diffraction theory for a plane wave (TEM) and in convergent-beam electron diffraction. With these theoretical chapters located at the end of the book, the author is able to focus on the concepts important to imaging at the nanoscale in Parts I and II.
The included figures, both electron microscopy photographs as well as schematics, are useful to understand the material covered. The references in each chapter are up to date. The problems included in the book are helpful for students, although I would have liked to have seen more problems in each chapter. The theoretical background is appropriate for graduate students in physical science.
I strongly recommend this book as a resource for electron microscopists with a basic knowledge of TEM and STEM who are interested in advanced imaging and diffraction techniques. The book is up to date on recent developments in electron microscopy.
Reviewer: Lourdes Salamanca-Riba is a professor in the Department of Materials Science and Engineering, University of Maryland, USA.
