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Aspects of Tip Shape Characterization for Nanoindentation of Compliant Materials

Published online by Cambridge University Press:  01 February 2011

Mark R. VanLandingham ,
Thomas F. Juliano  and
Matthew J. Hagon
Mark R. VanLandingham
Affiliation:
U. S. Army Research Laboratory, Weapons and Materials Research Directorate, Aberdeen Proving Ground, MD 21005–5069
Thomas F. Juliano
Affiliation:
U. S. Army Research Laboratory, Weapons and Materials Research Directorate, Aberdeen Proving Ground, MD 21005–5069
Matthew J. Hagon
Affiliation:
U. S. Army Research Laboratory, Weapons and Materials Research Directorate, Aberdeen Proving Ground, MD 21005–5069
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Abstract

The application of nanoindentation methods to compliant materials, such as polymeric and biological materials, often requires the use of instrumentation designed with enhanced force sensitivity, which limits its maximum force level. Because tip geometry is normally characterized using indentation of fused silica, the maximum contact depths achieved by low-force instruments during this calibration are often less than 300 nm. However, penetration into more compliant materials can be several micrometers or more. Extrapolation of tip shape data from fused silica indentation can lead to significant uncertainties in the indentation measurements for compliant materials. In this paper, atomic force microscopy (AFM) is used to provide tip shape information for a Berkovich tip and a series of conical tips. Use of AFM allows a larger range of depth to be calibrated and provides three-dimensional tip information.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 841: Symposium R – Fundamentals of Nanoindentation and Nanotribology III , 2004 , R9.2
Copyright
Copyright © Materials Research Society 2005

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References

REFERENCES

1. Oliver, W. C. and Pharr, G. M., J. Mater. Res. 7, 1564 (1992).Google Scholar
2. Lucas, B. N., Oliver, W. C., and Swindeman, J. E., in Fundamentals of Nanoindentation and Nanotribology, edited by Moody, N.R., Gerberich, W.W., Baker, S.P., and Burnham, N. (Mater. Res. Soc. Symp. 522, Pittsburgh, PA, 1998), pp. 3–14.Google Scholar
3. Herrmann, K., Jennett, N. M., Wegener, W., Meneve, J., Hasche, K., and Seemann, R., Thin Solid Films 377/378, 394 (2000).Google Scholar
4. VanLandingham, M. R., Villarrubia, J. S., Guthrie, W. F., and Meyers, G. F., in Advances in Scanning Probe Microscopy of Polymers, edited by Tsukruk, V. V. and Spencer, N. D. (Macromolecular Symp. 167, Wiley-VCH Verlag GmbH, Weinheim, Germany 2001), pp. 15–44.Google Scholar