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Photoluminescence, Magnetospectroscopy, and Resonant Electronic Raman Studies of Heteroepitaxial Gallium Nitride

Published online by Cambridge University Press:  13 June 2014

B.J. Skromme*
Affiliation:
Department of Electrical Engineering and Center for Solid State Electronics Research, Arizona State University

Abstract

Optical spectroscopy, including low and room temperature photoluminescence (PL), reflectance, PL measurements in high magnetic fields up to 12 T, and resonantly-enhanced electronic Raman scattering (RERS) in zero and high magnetic field, has been used to investigate exciton and impurity states and surface recombination in high quality heteroepitaxial GaN grown on sapphire and SiC. Theoretical finite-difference calculations of the donor states as a function of magnetic field have been carried out for comparison, including the effects of anisotropy in the effective mass and dielectric constant. Up to six residual donor species are observed in material grown by hydride vapor phase epitaxy (HVPE) and metalorganic chemical vapor deposition (MOCVD) from their n=2 and n=3 two-electron satellites observed in PL and by RERS. The donor-related nature of the relevant transitions is confirmed from their magnetic field dependence, and the spectral resolution is improved at high fields. The Si donor level is determined to have a binding energy of about 21 meV from observation of its two-electron satellite in lightly Si-doped HVPE material. The free exciton binding energy is shown to be about 26.4 meV, independent of strain, based on observations of the n=2 free exciton. The room temperature band-edge PL peak is confirmed to be free excitonic in nature, based on its linewidth and on comparison with simple reflectance measurements. Reflectance from the edge of a thick HVPE layer shows clear evidence of A, B, and C excitons obeying the relevant selection rules at both low and room temperature. Surface chemical treatments are shown to have substantial effects on room temperature PL efficiency. Passivation with ammonium or sodium sulfide solutions, in particular, yields increases in PL efficiency by a factor of five to seven over air-exposed surfaces. The passivation effect is stable in air, lasting at least one month.

Information

Type
Research Article
Copyright
Copyright © 1999 Materials Research Society
Figure 0

Figure 1. Results of our theoretical calculation for the energy levels of a Coulombic donor state in GaN as a function of magnetic field (lines). Notation is that of isotropic H atom in low field limit. States are listed in order of increasing energy within each group in the legend (e.g., ns, 2p, 3p, 3d states). Points show corresponding perturbation theory (PT) results (only 3p- shown of n=3 states for clarity; others deviate similarly from accurate calculation).

Figure 1

Figure 2. Excitonic 1.7 K PL spectra of the undoped Epitronics HVPE-1 300 µm GaN/Al2O3sample as a function of magnetic field in Faraday configuration with B||[0 0 0 1]. Only one of the two possible circular polarizations is detected in these spectra.

Figure 2

Table I Spectroscopic Binding Energies

Figure 3

Figure 3. Excitonic PL spectra of the Epitronics HVPE-1 sample as a function of temperature.

Figure 4

Figure 4. Excitonic 1.7 K PL spectra of four Epitronics HVPE samples with various Si doping levels. Lowest spectrum is for undoped sample; next lowest is for sample with ND-NA = 5 × 1016 cm−3; second from top is for sample with ND-NA = 2.5 × 1017 cm−3; top spectrum is for sample with ND-NA = 4 × 1017 cm−3.

Figure 5

Figure 5. Shifted Raman spectrum (upper) and PL spectrum (lower) of the Lincoln Laboratories HVPE-2 sample; actual laser energy during the Raman measurement was 3.407 eV. The ERS peaks are denoted in the upper spectrum.

Figure 6

Figure 6. Electronic Raman spectra [] as a function of magnetic field at 1.7 K for the sample of Figure 5.

Figure 7

Figure 7. Reflectance spectrum of Epitronics HVPE-1 sample (top), and PL spectra of HVPE-1, the Lincoln Labs HVPE-2 sample, and an MOCVD sample (bottom three, listed from top to bottom).

Figure 8

Figure 8. 1.7 K reflectance spectrum of Epitronics HVPE-1 sample recorded from the edge of the sample (see inset) in two orthogonal linear polarizations (upper spectrum, σ -polarization; lower spectrum, π-polarization).

Figure 9

Figure 9. Room temperature reflectance (upper) and PL (lower) spectra of a 10 µm thick undoped HVPE Epitronics GaN/Al2O3 sample.

Figure 10

Figure 10. Long term stability of 300 K PL intensity of sulfide-treated HVPE GaN; intensity was 1.0 prior to treatment. Times refer to periods of continuous laser illumination.