Hostname: page-component-77f85d65b8-45ctf Total loading time: 0 Render date: 2026-04-22T23:48:14.174Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Holography of Flux Lattices in Niobium

Published online by Cambridge University Press:  21 February 2011

J.E. Bonevich ,
K. Harada ,
T. Matsuda ,
H. Kasai ,
T. Yoshida ,
G. Pozzi  and
A. Tonomura
J.E. Bonevich
Affiliation:
Hitachi Advanced Research Laboratory, Hatoyama, Saitama 350-03, JAPAN
K. Harada
Affiliation:
Hitachi Advanced Research Laboratory, Hatoyama, Saitama 350-03, JAPAN
T. Matsuda
Affiliation:
Hitachi Advanced Research Laboratory, Hatoyama, Saitama 350-03, JAPAN
H. Kasai
Affiliation:
Hitachi Advanced Research Laboratory, Hatoyama, Saitama 350-03, JAPAN
T. Yoshida
Affiliation:
Hitachi Advanced Research Laboratory, Hatoyama, Saitama 350-03, JAPAN
G. Pozzi
Affiliation:
Dept. of Physics, Univ. of Bologna, via Iternio 46, 40126 Bologna, ITALIA
A. Tonomura
Affiliation:
Hitachi Advanced Research Laboratory, Hatoyama, Saitama 350-03, JAPAN
Get access

Abstract

Magnetic lines of force penetrating a superconducting thin foil have been investigated by means of electron holography. A field-emission TEM with a specially constructed cold stage was used to cool a Nb thin foil down to 4.5 K and apply magnetic fields up to 100 G. The specimen is tilted by 45° to both the electron beam and the magnetic field (applied horizontally) allowing the 2-D lattice of penetrating flux-lines to be discerned. The phase distribution of electrons transmitted through the specimen were quantitatively measured. Interference micrographs revealed tiny regions where the phase distribution rapidly changed. These regions coincided spatially with the spot-like contrast observed by Lorentz microscopy and were found to be quantized vortices containing a flux of h/2e. The experimental results were in good agreement with those predicted by theoretical simulations. Experiments exploring the vortex inner core structure at high resolution are presented.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1. Essman, V. and Trtiuble, H., Phys. Lett. A 24, 526 (1967).Google Scholar
2. Dolan, G.J. et al. , Phys. Rev. Lett. 62, 2184 (1989).CrossRefGoogle Scholar
3. Hess, H.F. et al. , Phys. Rev. Lett. 62, 214 (1989).Google Scholar
4. Tonomura, A., Rev. Mod. Phys. 59, 639 (1987).Google Scholar
5. Matsuda, T. et al. , Phys. Rev. Lett. 66, 457 (1991).CrossRefGoogle Scholar
6. Harada, K. et al. , Nature 360, 51 (1992).Google Scholar
7. Harada, K. et al. , Phys. Rev. Lett. 71, 3371 (1993).Google Scholar
8. Migliori, A., Pozzi, G. and Tonomura, A., Ultramicroscopy 49, 87 (1993).Google Scholar
9. Chapman, J.N., J. Phys. D 17, 623 (1984).Google Scholar
10. Bonevich, J.E. et al. , Phys. Rev. Lett. 70, 2952 (1993).Google Scholar
11. Kawasaki, T. et al. , Jpn. J. Appl. Phys. 29, L508 (1990).Google Scholar
12. Möllenstedt, G. and Dtiker, H., Naturwissenschaften 42, 41 (1955).Google Scholar
13. Endo, J., Kawasaki, T., Matsuda, T., Osakabe, N. and Tonomura, A., Proc. of the 13th Internat'l. Comm. for Optics, edited by Ohzu, H. (ICO, Sapporo, 1984), p. 480.Google Scholar
14. Matteucci, G. et al. , J. Appl. Phys. 69, 1835 (1991).Google Scholar
15. Aharonov, Y. and Bohm, D., Phys. Rev. 115, 485 (1959).Google Scholar
16. Pozzi, G., Bonevich, J. and Tonomura, A., Proc. 51th Ann. Meet. Microsc. Soc. Amer., edited by Bailey, G.W. (San Francisco Press, San Francisco, 1993), p. 1224.Google Scholar