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Frontiers of in situ electronmicroscopy

Published online by Cambridge University Press:  13 January 2015

Haimei Zheng
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, USA; hmzheng@lbl.gov
Ying Shirley Meng
Affiliation:
Department of NanoEngineering and Materials Science Program, University of California–San Diego, USA; shirleymeng@ucsd.edu
Yimei Zhu
Affiliation:
Institute for Advanced Electron Microscopy, Brookhaven National Laboratory, USA; zhu@bnl.gov

Abstract

In situ transmission electron microscopy (TEM) has become anincreasingly important tool for materials characterization. It provides keyinformation on the structural dynamics of a material during transformations andthe ability to correlate a material’s structure and properties. Withthe recent advances in instrumentation, including aberration-corrected optics,sample environment control, the sample stage, and fast and sensitive dataacquisition, in situ TEM characterization has become morepowerful. In this article, a brief review of the current status and futureopportunities of in situ TEM is provided. The article alsointroduces the six articles in this issue of MRS Bulletinexploring the frontiers of in situ electron microscopy,including liquid and gas environmental TEM, dynamic four-dimensional TEM,studies on nanomechanics and ferroelectric domain switching, andstate-of-the-art atomic imaging of light elements (i.e., carbon atoms) andindividual defects.

Information

Type
Introduction
Copyright
Copyright © Materials Research Society 2015 
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Figure 1. In situ environmental transmission electron microscope study of catalytic Au nanoparticles (NPs) supported on CeO2. Au NP on CeO2 (a) in ultrahigh vacuum (UHV) and (b) in a gas environment that contained 1 vol% CO in air at 45 Pa at room temperature. Higher magnification images of these regions are shown at the bottom of the corresponding panels. The difference between (a) and (b) shows that the interlayer distance of Au NPs in 1 Torr (∼133 Pa ∼1.3 mbar) CO increases in contrast to that in UHV. (c) High-magnification image of Au NPs with adsorbed CO. (d) Simulated image based on an energetically favorable model, which corresponds to the selected region in (c).6 Adapted from Reference 6. © 2012 American Association for the Advancement of Science.

Figure 1

Figure 2. (a) Graphene liquid cell and in situ high-resolution transmission electron microscope imaging of Pt nanoparticle growth.7 (b) The arrow indicates a small cluster attaching to the existing nanoparticle. A twinned Pt nanoparticle is achieved with a (111) mirror plane, as shown in the fast Fourier transform pattern at the bottom right. Scale bar in the image sequence is 2 nm. Note: Z.A., zone axis. Adapted from Reference 7. © 2012 American Association for the Advancement of Science.

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Figure 3. Electron energy-loss spectroscopy (EELS) mapping and scanning transmission electron microscopy (STEM) images of a solid-state Si/LiPON/LiCoO2 rechargeable battery. Reprinted with permission from Reference 45. © 2013 American Chemical Society.

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Figure 4. Visualizing vortex dynamics in a nanomagnet. Top: The spin precession measurement scheme. Yellow indicates two electrodes allowing GHz electric current (j(t), where t is time) to sweep across the Landau domain structure with a clockwise chirality (in-plane magnetization) and a counter-clockwise vortex-core polarity (out-of-plane magnetization). Bottom: Lorentz micrograph of the permalloy square with the Landau state showing the vortex core orbit under resonance excitation in a transmission electron microscope. The vortex core size is approximately 20 nm.16

Figure 4

Figure 5. Example of a typical compression-to-failure in situ compression test on an individual nanocrystalline hollow CdS sphere. (a–c) Extracted video frames of the in situ compression test, corresponding to time t = (a) 0 s, (b) 1.8 s, and (c) 3.6 s. The estimated contact diameter is shown in red in (b). (d–e) Dark-field transmission electron microscope images of the hollow nanocrystalline CdS ball resting on the Si substrate (d) before and (e) after the compression test. (f) Load and displacement data from the loading portion of the in situ test versus time. The experiment was run under displacement control. Reproduced with permission from Reference 15. © 2008 Nature Publishing Group.

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Figure 6. Future in situ electron microscopy allowing multimodal probing of material functionalities. (Figure created by Hong-Gang Liao and Haimei Zheng.) Note: TEM, transmission electron microscopy; ETEM, environmental transmission electron microscopy; a-Si, amorphous Si.