Hostname: page-component-6766d58669-nf276 Total loading time: 0 Render date: 2026-05-15T22:41:27.860Z Has data issue: false hasContentIssue false
  • English
  • Français

Rapid Non-Destructive Testing of Ceramic Multilayer Capacitors by a Resonance Method

Published online by Cambridge University Press:  21 February 2011

O. Boser ,
P. Kellawon  and
R. Geyer
O. Boser
Affiliation:
Philips Laboratories North American Philips Corporation Briarcliff Manor, N.Y. 10510
P. Kellawon
Affiliation:
Philips Laboratories North American Philips Corporation Briarcliff Manor, N.Y. 10510
R. Geyer
Affiliation:
Philips Laboratories North American Philips Corporation Briarcliff Manor, N.Y. 10510
Get access

Abstract

A rapid non-destructive test method for ceramic multilayer capacitors made from piezoelectric materials such as barium titanate or lead containing materials is described and evaluated. The test method is based on the internal excitation of standing acoustic waves in the capacitors. The standing waves are severely dampened by defects such as delaminations and pores. An undampened resonance is a good indication of a defect free ceramic multilayer capacitor. This finding was used in a nondestructive test set-up to evaluate about 1,000 capacitors. The test set-up has the potential to test over 100,000 capacitors an hour. Through metallographic (cross section) examination a sorting accuracy of 2% false accepts and 8% false rejects was determined for the high speed test set-up.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 142: Symposium U – Nondestructive Monitoring of Materials Properties , 1988 , 329
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

(1) Kiernan, G. F., “Comparison of Screening Techniques for Ceramic Capacitors,” Proc. of Symposium held at Marshall Space Flight Center, NASA Conference Publication # 2186, Marshall Space Flight Center, Alabama, 1981 Google Scholar
(2) Vorres, C. L., Yuhas, D. E. and Kessler, L. W. “Non-Destructive Evaluation of Ceramic Chip Capacitors by Means of the Scanning Laser Acoustic Microscope,” 2nd Capacitor and Resistor Technology Symposium, pp. F3–1, Components Technology Inst., Inc, Suite 1122-K, 303 Williams Ave., Huntsville, Alabama, 35801, 1982 Google Scholar
(3) Kahn, S. R. and Checkaneck, R. W., “Acoustic Emission Testing of Multilayer Ceramic Capacitors,” IEEE Transactions on Components, Hybrids and Manufacturing Technology, 6, p. 517–526, 1983 Google Scholar
(4) Chan, N. H. and Rawal, B. S., “An Electrically Excited Acoustic Emission Test Technique for Screening Multilayer Ceramic Capacitors” Proceedings of the Electronic Components Conf., Los Angeles, CA, 1988, vol.38, pp. 502–506, publ. by IEEE and EIA, New YorkGoogle Scholar
(5) Boser, O., US Patent #4,644,259, February 1987 Google Scholar
(6) Boser, O., “Electromagnetic Resonances in Ceramic Capacitors and Evaluation of the Piezoelectric Materials' Properties,” Advanced Ceramic Materials, 2, pp. 167–172, 1987 CrossRefGoogle Scholar
(7) “Operations and Service Manual for Model #4192A Impedance Analyzer,” Yokogawa - Hewlett - Packard Ltd, Tokyo, Japan, March 1983 Google Scholar
(8) “EIA Standards Manual for Ceramic Dielectric Capacitors, Classes I, II, III and IV” RS-198-C Revision of RS-198-B, November 1983, Electrical Industries Association, Engineering Dept. 2001 Eye St. Washington, DC 20006.Google Scholar
(9) Landoldt-Bornstein, Vol.3, Editors: Hellwege, K.-H. and Hellwege, A. M., Springer Verlag, Heidelberg, 1969 Google Scholar
(10) Belincourt, D. A., Curran, D. R. and Jaffe, H., “Piezoelectric and Piezomagnetic Materials and Their Function in Transducers” Physical Acoustics, Vol.1, Part A, Editor: Masson, W. A. Academic Press, New York, 1964, p. 169–270 CrossRefGoogle Scholar
(11) Holland, R. and EerNisse, E. P., “Design of Resonant Piezoelectric Devices” Research Monograph #56, The MIT Press, Cambridge, Mass, 1969.Google Scholar
(12) Baranov, V. M. and Kudryavtsev, E. M., “Application of the Ultrasonic Resonance Method in the Inspection of Small Products,” Soviet J. Non-Destructive Testing, 15, pp. 750–755, 1980 Google Scholar
(13) Testardi, L. R., Norton, S. J. and Hsieh, T., “Determination of Inhomogeneities of Elastic Modulus and Density for One-Dimensional Structures Using Acoustic Dimensional Resonances,” J. Applied Physics, 56, pp. 2681–2685, 1984 CrossRefGoogle Scholar
(14) Testardi, L. R., Norton, S. J. and Hsieh, T., “Acoustic Dimensional Resonance Tomography: Some Examples in One-Dimensional Systems,”.J. Applied Physics, 59, pp. 55–58, 1985 CrossRefGoogle Scholar