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Seeing dynamic phenomena with live scanning tunneling microscopy

Published online by Cambridge University Press:  10 November 2017

Joost W.M. Frenken  and
Irene M.N. Groot
Joost W.M. Frenken
Affiliation:
Advanced Research Center for Nanolithography, The Netherlands; frenken@arcnl.nl
Irene M.N. Groot
Affiliation:
Leiden Institute of Chemistry, Leiden University, The Netherlands; i.m.n.groot@lic.leidenuniv.nl
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Abstract

Scanning tunneling microscopy (STM) is an excellent technique to image the surfaces of materials with extreme spatial resolution. However, it is difficult to maintain its imaging quality when applying the technique under the conditions used in many practical processes, such as chemical vapor deposition and catalysis. In this article, we describe two special classes of STM instruments that are capable of maintaining good imaging quality under “difficult” conditions, namely, one for high and variable temperatures and the other for the combination of high temperatures and high gas pressures. In both cases, we discuss the special design features that make these instruments robust with respect to the challenging imaging conditions and provide examples to illustrate how they are applied.

Keywords

scanning tunneling microscopy (STM)scanning probe microscopy (SPM)chemical vapor deposition (CVD) (deposition)surface chemistrycatalytic
Type
Research Article
Information
MRS Bulletin , Volume 42 , Issue 11: Catalysts for Nanocarbon Growth , November 2017 , pp. 834 - 841
Copyright
Copyright © Materials Research Society 2017 

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