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A Bayesian approach for correcting for partial plating in fluctuation experiments

Published online by Cambridge University Press:  06 September 2011

QI ZHENG*
Affiliation:
Department of Epidemiology and Biostatistics, School of Rural Public Health, Texas A&M Health Science Center, College Station, TX 77843, USA
*
*Corresponding author: Department of Epidemiology and Biostatistics, School of Rural Public Health, Texas A&M Health Science Center, College Station, TX 77843, USA. e-mail: qzheng@srph.tamhsc.edu
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Summary

The fluctuation experiment is the preferred method for estimating microbial mutation rates. A difficult task facing the data analyst is to infer the mean number of mutations from the number of mutant cells that only indirectly reflects the number of mutations. Partial plating, commonly practised in the laboratory, renders this task even more challenging by allowing only a portion of the mutant cells to be counted. In this paper, we propose a Bayesian approach to correcting for partial plating in the analysis of fluctuation experiments.

Information

Type
Research Papers
Copyright
Copyright © Cambridge University Press 2011
Figure 0

Fig. 1. Three truncated normal density functions Ntrunc(0·1, υ, 0·05, 0·15) with different values of υ, which can be considered as prior distributions for ε when the intended plating efficiency is ε0=0·1.

Figure 1

Fig. 2. Contour plot of the posterior joint density of ζ1 and ζ2 along with the last 500 draws of a simulated chain for the data given in eqn (2).

Figure 2

Fig. 3. Trace plot of the last 2000 ζ1 draws for the analysis of data given in eqn (2).

Figure 3

Fig. 4. Histogram of 5000 simulated values of the mean number of mutations m=eζ1. In this simulation for the data in eqn (2) the prior for ε was Ntrunc(0·1, 10−4, 0·05, 0·15).

Figure 4

Fig. 5. The same simulation recipe described in the last section were repeated 1000 times with random tuning parameters. From the top panel to the bottom, the box plots describe the 0·025, 0·500 and 0·975 posterior quantiles, respectively, for the data given in eqn (2).