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How fast do we forget our past social interactions? Understanding memory retention with parametric decays in relational event models

Published online by Cambridge University Press:  04 April 2023

Giuseppe Arena*
Affiliation:
Department of Methodology and Statistics, Tilburg School of Social and Behavioral Sciences, Tilburg University, Tilburg, The Netherlands
Joris Mulder
Affiliation:
Department of Methodology and Statistics, Tilburg School of Social and Behavioral Sciences, Tilburg University, Tilburg, The Netherlands Jheronimus Academy of Data Science, ’s-Hertogenbosch, The Netherlands
Roger Th. A.J. Leenders
Affiliation:
Jheronimus Academy of Data Science, ’s-Hertogenbosch, The Netherlands Department of Organization Studies, Tilburg School of Social and Behavioral Sciences, Tilburg University, Tilburg, The Netherlands
*
*Corresponding author. Email: G.Arena@tilburguniversity.edu
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Abstract

In relational event networks, endogenous statistics are used to summarize the past activity between actors. Typically, it is assumed that past events have equal weight on the social interaction rate in the (near) future regardless of the time that has transpired since observing them. Generally, it is unrealistic to assume that recently past events affect the current event rate to an equal degree as long-past events. Alternatively one may consider using a prespecified decay function with a prespecified rate of decay. A problem then is that the chosen decay function could be misspecified yielding biased results and incorrect conclusions. In this paper, we introduce three parametric weight decay functions (exponential, linear, and one-step) that can be embedded in a relational event model. A statistical method is presented to decide which memory decay function and memory parameter best fit the observed sequence of events. We present simulation studies that show the presence of bias in the estimates of effects of the statistics whenever the decay, as well as the memory parameter, are not properly estimated, and the ability to test different memory models against each other using the Bayes factor. Finally, we apply the methodology to two empirical case studies.

Information

Type
Research Article
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted re-use, distribution and reproduction, provided the original article is properly cited.
Copyright
© The Author(s), 2023. Published by Cambridge University Press
Figure 0

Figure 1. Three examples of memory decay: (a) One-step decay where $\theta _{\text{max}}\approx 2\ \text{months}$ and the height of the step is fixed to 1; (b) exponential decay where $\theta _{\text{half-life}}\approx 7\ \text{days}$; (c) linear decay where $\theta _{\text{half-life}}\approx 2\ \text{months}$.

Figure 1

Figure 2. Negative profile log-Likelihood for the log-half-life parameter (exponential memory decay with true value $\psi = \ln{(4)} \approx 1.386$, dashed vertical line) for one randomly simulated event history.

Figure 2

Figure 3. Simulation 1 (the true decay is exponential). Trend of the maximum likelihood estimates over the logarithm of the memory parameter, $\psi$, and under each of the three memory decays (exponential, linear, and one-step). The shaded regions delimit the first and the third quartile of the distribution (based on 100 simulated event sequences) of the estimated effect $\beta$ over $\psi$. The black lines show the trend of the median of each effect across the 100 simulations, and they have a different line type according to each parametrization. The diamond-shaped point marks the coordinates of the true memory parameter ($\ln{(4)}\approx 1.386$) and the true value of each specific effect.

Figure 3

Figure 4. Simulation 1 (comparison between rescaled negative profile log-Likelihoods across simulations). The y-axis is the $-\ln{(L_{\text{p}})}$ that is rescaled based on the global minimum across the three parametrizations and the local minimum within each parametrization. The figure shows three regions with different line types, one per each parametrization. Each region represents the (rescaled) value assumed by the 95% of the simulations in one parametrization across different values of the memory parameter (here on its logarithmic scale on the x-axis). The vertical dashed bold line marks the true value for the logarithm of the memory parameter ($\psi = \ln{(4)}\approx 1.386$). The three weight decays result in showing about the same evidence towards small values of the memory parameter (negative values on the logarithmic scale) as well as towards larger values (greater than 3.0 on the logarithmic scale). However, when in the neighborhood close to the true value of the memory parameter, the tree parametrizations show a diverging evidence, with the Exponential model being the lowest, which is the true parametrization used in the generation of the 100 event sequences.

Figure 4

Figure 5. Simulation 2 (the true decay is linear). Trend of the maximum likelihood estimates over the logarithm of the memory parameter, $\psi$, and under each of the three memory decays (exponential, linear, and one-step). The shaded regions delimit the first and the third quartile of the distribution (based on 100 simulated event sequences) of the estimated effect $\beta$ over $\psi$. The black lines show the trend of the median of each effect across the 100 simulations, and they have a different line type according to each parametrization. The diamond-shaped point marks the coordinates of the true memory parameter ($\ln{(4)}\approx 1.386$) and the true value of each specific effect.

Figure 5

Figure 6. Simulation 2 (comparison between rescaled negative profile log-Likelihoods across simulations). The y-axis is the $-\ln{(L_{\text{p}})}$ that is rescaled based on the global minimum across the three parametrizations and the local minimum within each parametrization. The figure shows three regions with different line types, one per each parametrization. Each region represents the (rescaled) value assumed by the 95% of the simulations in one parametrization across different values of the memory parameter (here on its logarithmic scale on the x-axis). The vertical dashed bold line marks the true value for the logarithm of the memory parameter ($\psi$ = $\ln{(4)}\approx 1.386$). The three weight decays result in showing about the same evidence towards small values of the memory parameter (negative values on the logarithmic scale) as well as towards larger values (greater than 3.0 on the logarithmic scale). However, when in the neighborhood close to the true value of the memory parameter, the tree parametrizations show a diverging evidence, with the Linear model being the lowest, which is the true parametrization used in the generation of the 100 event sequences.

Figure 6

Figure 7. Simulation 3 (the true decay is one-step). Trend of the maximum likelihood estimates over the logarithm of the memory parameter, $\psi$, and under each of the three memory decays (exponential, linear, and one-step). The shaded regions delimit the first and the third quartile of the distribution (based on 100 simulated event sequences) of the estimated effect $\beta$ over $\psi$. The black lines show the trend of the median of each effect across the 100 simulations, and they have a different line type according to each parametrization. The diamond-shaped point marks the coordinates of the true memory parameter ($\ln{(4)}\approx 1.386$) and the true value of each specific effect.

Figure 7

Figure 8. Simulation 3 (comparison between rescaled negative profile log-Likelihoods across simulations). The y-axis is the $-\ln{(L_{\text{p}})}$ that is rescaled based on the global minimum across the three parametrizations and the local minimum within each parametrization. The figure shows three regions with different line types, one per each parametrization. Each region represents the (rescaled) value assumed by the 95% of the simulations in one parametrization across different values of the memory parameter (here on its logarithmic scale on the x-axis). The vertical dashed bold line marks the true value for the logarithm of the memory parameter ($\psi$ = $\ln{(4)}\approx 1.386$). The three weight decays result in showing about the same evidence towards small values of the memory parameter (negative values on the logarithmic scale) as well as towards larger values (greater than 3.0 on the logarithmic scale). However, when in the neighborhood close to the true value of the memory parameter, the tree parametrizations show a diverging evidence, with the One-Step model being the lowest, which is the true parametrization used in the generation of the 100 event sequences.

Figure 8

Figure 9. Distribution of $\ln{(\text{BF})}$ (where $\ln{(\text{BF})}\gt 0$ translates to as evidence in favor of the true model) : (a) in Simulation 1 the true weight decay is exponential, thus the two Bayes factors are $\text{BF}(\mathcal{M}_{\text{Exponential}},\mathcal{M}_{\text{Linear}})$ and $\text{BF}(\mathcal{M}_{\text{Exponential}},\mathcal{M}_{\text{One-Step}})$ and the number of simulations where $\ln{(\text{BF})}\gt 0$ is respectively 80 and 98 out of 100; (b) in Simulation 2 the true weight decay is linear, thus the two Bayes factors are $\text{BF}(\mathcal{M}_{\text{Linear}},\mathcal{M}_{\text{Exponential}})$ and $\text{BF}(\mathcal{M}_{\text{Linear}},\mathcal{M}_{\text{One-Step}})$ and the number of simulations where $\ln{(\text{BF})}\gt 0$ is respectively 95 and 98 out of 100; (c) in Simulation 3 the true weight decay is one-step, thus the two Bayes factors are $\text{BF}(\mathcal{M}_{\text{One-Step}},\mathcal{M}_{\text{Linear}})$ and $\text{BF}(\mathcal{M}_{\text{One-Step}},\mathcal{M}_{\text{Exponential}})$ and the number of simulations where $\ln{(\text{BF})}\gt 0$ is respectively 99 and 100 out of 100.

Figure 9

Figure 10. Simulation 4 (the true waiting time in the 100 simulated event sequences is distributed as a Weibull with shape parameter equal to $0.5$). Distribution of the maximum likelihood estimates of the effects of the statistics as well as the memory parameter in a REM (with piece-wise constant hazard assumption). Each vertical dashed line corresponds to the true value of each effect.

Figure 10

Figure 11. (Indian data) negative profile log-Likelihood ($-\ln{L_{p}(\psi )}$) under each of the three memory decays (exponential, linear, and one-step).

Figure 11

Figure 12. (Indian data) trend of the maximum likelihood estimates (MLEs) for the exponential decay over $\psi$ (logarithm of the memory parameter). The dashed black lines in each plot mark the estimate for the log-memory-parameter $\hat{\psi }_{\text{MLE}}$ (vertical lines) and the estimates of the effects $\boldsymbol{\beta }$ (horizontal lines) at the corresponding $\hat{\psi }_{\text{MLE}}$. The shaded regions are the 95% confidence intervals for the effects $\boldsymbol{\beta }$ estimated at any value of $\psi$.

Figure 12

Table 1. (Indian data) BIC of the best model (where the memory parameter is optimized) under each of the three memory decays (exponential, linear, and one-step) and for the model w/o memory. The lowest BIC is the one of the exponential model (56,753.55), and the two log-Bayes-factor are calculated based on the following model comparisons: $\text{BF}(\mathcal{M}_{\text{Exponential}},\mathcal{M}_{\text{Linear}})$, $\text{BF}(\mathcal{M}_{\text{Exponential}},\mathcal{M}_{\text{One-Step}})$, and $\text{BF}(\mathcal{M}_{\text{Exponential}},\mathcal{M}_{\text{w/o memory}})$.

Figure 13

Table 2. (Indian data) Maximum likelihood estimates for the exponential decay. The estimate of the logarithm of the memory parameter is $4.156$, that is an half-life of $\exp\!(4.156)\approx 64\,\text{days}$. Estimates of effects $\boldsymbol{\beta }$ are all significant.

Figure 14

Figure 13. (Indian data) ROC curve of model with exponential memory decay and model without memory.

Figure 15

Table 3. (Sms data) Dimensions of the three sub-networks used in the example

Figure 16

Figure 14. (Sms data) negative profile log-Likelihood ($-\ln{L_{p}(\psi )}$) under each of the three memory decays (exponential, linear, and one-step) and for each sub-network (one cluster, two clusters, and eight clusters).

Figure 17

Figure 15. Sms data (eight clusters): trend of the maximum likelihood estimates (MLEs) for the exponential decay over $\psi$ (logarithm of the memory parameter). The dashed black lines in each plot mark the estimate for the log-memory-parameter $\hat{\psi }_{\text{MLE}}$ (vertical lines) and the estimates of the effects $\boldsymbol{\beta }$ (horizontal lines) at the corresponding $\hat{\psi }_{\text{MLE}}$. The shaded regions are the confidence intervals at 0.95 for the effects $\boldsymbol{\beta }$ estimated at any value of $\psi$. For the Transitivity Closure (TClosure) estimates are plotted for an interval of $\psi$ to make the trend much more readable.

Figure 18

Table 4. (Sms data) Per each sub-network (one cluster, two clusters, eight clusters) the BIC of the best model (where the memory parameter is optimized) under each of the three memory decays (exponential, linear, and one-step) and for the model w/o memory. In all the sub-networks, The lowest BIC is the one of the exponential model, and the two log-Bayes-factor are calculated based on the following model comparisons: $\text{BF}(\mathcal{M}_{\text{Exponential}},\mathcal{M}_{\text{Linear}})$, $\text{BF}(\mathcal{M}_{\text{Exponential}},\mathcal{M}_{\text{One-Step}})$ and $\text{BF}(\mathcal{M}_{\text{Exponential}},\mathcal{M}_{\text{w/o memory}})$.

Figure 19

Table 5. (Sms data) Maximum likelihood estimates for the exponential decay in each of the three sub-networks (1 cluster, 2 clusters, 8 clusters). The estimate of the logarithm of the memory parameter ($\exp\!(\hat{\psi })$) ranges approximately between $84$ and $92\,\text{h}$ in the three networks. Estimates of effects $\boldsymbol{\beta }$ are overall significant.

Figure 20

Figure 16. (Sms data): ROC curve of model with exponential memory decay and model without memory for the three sub-networks (one cluster, two clusters, and eight clusters).

Figure 21

Figure 17. (Sms data): Median running time of one iteration in the optimization stage. The model that is estimated in the optimization stage is the same one introduced in the data example in Section 5.2. The time is reported in seconds (on the y-axis), the sequence length is the number of events considered (on the x-axis). The first and the second sub-sequence (networks with one and two clusters) do not show running times for larger lengths because they reach their maximum length (see Table 3).

Figure 22

Figure A1. Sms data (1 cluster): trend of the maximum likelihood estimates (MLEs) for the exponential decay over ψ (logarithm of the memory parameter). The dashed black lines in each plot mark the estimate for the log-memory-parameter $\hat{\psi }_{\text{MLE}}$ (vertical lines) and the estimates of the effects β (horizontal lines) at the corresponding $\hat{\psi }_{\text{MLE}}$. The shaded regions are the confidence intervals at 0.95 for the effects β estimated at any value of ψ.

Figure 23

Figure A2. Sms data (2 clusters): trend of the maximum likelihood estimates (MLEs) for the exponential decay over ψ (logarithm of the memory parameter). The dashed black lines in each plot mark the estimate for the log-memory-parameter $\hat{\psi }_{\text{MLE}}$ (vertical lines) and the estimates of the effects β (horizontal lines) at the corresponding $\hat{\psi }_{\text{MLE}}$. The shaded regions are the confidence intervals at 0.95 for the effects β estimated at any value of ψ.