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Validation of XRD phase quantification using semi-synthetic data

Published online by Cambridge University Press:  13 October 2020

Nicola Döbelin*
Affiliation:
RMS Foundation, Bischmattstrasse 12, Bettlach 2544, Switzerland
*
Author to whom correspondence should be addressed. Electronic mail: nicola.doebelin@rms-foundation.ch

Abstract

Validating phase quantification procedures of powder X-ray diffraction (XRD) data for an implementation in an ISO/IEC 17025 accredited environment has been challenging due to a general lack of suitable certified reference materials. The preparation of highly pure and crystalline reference materials and mixtures thereof may exceed the costs for a profitable and justifiable implementation. This study presents a method for the validation of XRD phase quantifications based on semi-synthetic datasets that reduces the effort for a full method validation drastically. Datasets of nearly pure reference substances are stripped of impurity signals and rescaled to 100% crystallinity, thus eliminating the need for the preparation of ultra-pure and -crystalline materials. The processed datasets are then combined numerically while preserving all sample- and instrument-characteristic features of the peak profile, thereby creating multi-phase diffraction patterns of precisely known composition. The number of compositions and repetitions is only limited by computational power and storage capacity. These datasets can be used as input files for the phase quantification procedure, in which statistical validation parameters such as precision, accuracy, linearity, and limits of detection and quantification can be determined from a statistically sound number of datasets and compositions.

Information

Type
Technical Article
Creative Commons
Creative Common License - CCCreative Common License - BYCreative Common License - NCCreative Common License - ND
This is an Open Access article, distributed under the terms of the Creative Commons Attribution-NonCommercial-NoDerivatives licence (http://creativecommons.org/licenses/by-nc-nd/4.0/), which permits non-commercial re-use, distribution, and reproduction in any medium, provided the original work is unaltered and is properly cited. The written permission of Cambridge University Press must be obtained for commercial re-use or in order to create a derivative work
Copyright
Copyright © RMS Foundation, 2020. Published by Cambridge University Press on behalf of International Centre for Diffraction Data
Figure 0

Figure 1. Processing steps of a nearly pure zincite reference sample. (a) Standard scan and (b) a high signal-to-noise (HSN) scan measured with 20 times longer counting time, followed by rescaling the intensities by a factor 1/20. (c) Scan b after stripping of impurities and rescaling. (d) Scan c with added synthetic noise pattern. Artifacts exposed in scan b: (1) rutile impurities, (2) zincite peaks, (3) corundum impurities, and (4) zincite absorption edges.

Figure 1

Figure 2. Scanning electron microscopy images of the materials used in examples 1 and 2 after milling for XRD sample preparation: (a) rutile, (b) zincite, (c) α-TCP, (d) β-TCP, and (e) CDHA.

Figure 2

Figure 3. Rietveld refinement fits individual patterns for all phases and for the background to the measured data (stacked representation). The background was refined as a combination of a measured background and a polynomial function. The measured contribution shows tails of diffuse bumps at both sides of the displayed range, which are generated by the polymer sample holder.

Figure 3

TABLE I. Instrumental scale factors K calculated for all reference samples used in example 1.

Figure 4

Figure 4. 21 diffraction patterns of different composition created from the stripped and normalized zincite and rutile reference patterns. The patterns represent Isim [Eq. (17)], including the background signal and synthetic counting noise. Each composition was simulated and refined 10-fold, resulting in 210 multi-phase datasets created from two reference datasets. The legend shows the simulated phase composition in wt%.

Figure 5

Figure 5. Differences between refined and nominal zincite quantities obtained from three different refinement strategies. The x-axis is split into three segments to enhance the visibility of the data points close to 0 and 100 wt% zincite. The strategy optimized for the displayed compositional range is shown in red. Error bars represent standard deviations (n = 10).

Figure 6

TABLE II. Structural parameters refined in the three refinement strategies of example 1.

Figure 7

Figure 6. The measured HSN reference patterns of α-TCP, β-TCP, and CDHA after stripping of impurities and normalization to a common K factor show several regions of peak overlap among α-TCP and β-TCP, as well as among β-TCP and nano-crystalline CDHA.

Figure 8

Figure 7. An example refinement of example 2 (nominal composition 45 wt% α-TCP + 45 wt% CDHA + 10 wt% β-TCP) converged with χ2 = 1.20.

Figure 9

TABLE IV. Instrumental scale factors K calculated for all reference samples used in example 2.

Figure 10

TABLE V. Structural parameters refined in example 2.

Figure 11

TABLE III. Validated parameters for zincite and rutile using three different refinement strategies.

Figure 12

TABLE VI. Refinement results of example 2 containing α-TCP, CDHA, and β-TCP.

Figure 13

TABLE VII. Validated parameters for α-TCP and CDHA in a mixture containing 10 wt% β-TCP contamination.

Figure 14

Figure 8. The mean value $\lpar \bar{Q}\rpar$ and standard deviation (Std. Dev.) of the refined α-TCP phase quantity in example 2 fluctuated at low numbers of simulations, but stabilized when at least 29 datasets were processed. Between 29 and 99 repetitions, the mean value $\bar{Q}_{1 \ldots n}$ remained within one standard error (Std. Err.) from the mean value of 100 repetitions $\lpar \bar{Q}_{1 \ldots 100}\rpar$.