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Specimen Preparation for Transmission Electron Microscopy of Metals

Published online by Cambridge University Press:  21 February 2011

Peter J. Goodhew
Peter J. Goodhew*
Affiliation:
MicroStructural Studies Unit, University of Surrey, Guildford, GU2 5XH, England
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Abstract

The aim of thin foil preparation is to produce a specimen for microscopy which is representative of a larger volume of material, and in which the detail can be seen and interpreted. It is in general necessary to undertake some initial preparation before the final thinning process. Both stages are described. The final preparation methods described in this paper include electropolishing, ion beam thinning, ultramicrotomy and replication. A guide to the choice of technique is presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 115: Symposium W – Specimen Preparation for Transmission Electron Microscopy of Materials I , 1987 , 51
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

1. Goodhew, P.J., Specimen preparation for transmission electron microscopy Royal Microscopical Society Handbook No 3 (Oxford University Press, 1984)Google Scholar
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